D A T A S H E E T
TEST CONDITIONS
Table 7. Test Specifications
Test Condition
All Speed Options
Unit
Output Load Capacitance, CL
30
pF
(including jig capacitance)
Input Rise and Fall Times
Input Pulse Levels
Device
Under
Test
5
ns
V
0.0–2.0
C
L
Input timing measurement
reference levels
1.0
1.0
V
V
Output timing measurement
reference levels
Figure 11. Test Setup
Key to Switching Waveforms
WAVEFORM
INPUTS
OUTPUTS
Steady
Changing from H to L
Changing from L to H
Don’t Care, Any Change Permitted
Does Not Apply
Changing, State Unknown
Center Line is High Impedance State (High Z)
2.0 V
0.0 V
1.0 V
1.0 V
Input
Measurement Level
Output
Figure 12. Input Waveforms
and Measurement Levels
26
Am29SL400C
Am29SL400C_00_A6 January 23, 2007
AMD [ AMD ]
