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S2092TT 参数 Datasheet PDF下载

S2092TT图片预览
型号: S2092TT
PDF下载: 下载PDF文件 查看货源
内容描述: [Telecom Circuit, 1-Func, PQFP48, 7 X 7 MM, HEAT SINK, TQFP-48]
分类和应用: 电信电信集成电路
文件页数/大小: 15 页 / 132 K
品牌: AMCC [ APPLIED MICRO CIRCUITS CORPORATION ]
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SERIAL BACKPLANE RETIMER DEVICE  
S2092  
Table 3. Pin Assignment and Descriptions  
Pin Name  
Level  
I/O Pin#  
Description  
SERDATIP  
SERDATIN  
Diff.  
CML  
3
2
Serial Data In. Clock is recovered from the transitions on these inputs.  
Internally biased and terminated. (See Figure 8.)  
I
Active High. Used to bypass the PLL. It allows transmission of the data  
input without clock recovery.  
BYPASS  
LVTTL  
I
I
46  
45  
Signal Detect. Active Low. A single-ended 10K PECL input to be driven  
by the external optical receiver module to indicate a loss of received  
optical power. When SDN is inactive, the data on the Serial Data In  
(SERDATIP/N) pins will be internally forced to a constant zero and the  
PLL will be forced to lock to the REFCLK input. When SDN is active,  
data on the SERDATIP/N pins will be processed normally.  
Single  
Ended  
LVPECL  
SDN  
Reference Clock. 155.52 to 166.63 or 19.44 to 20.83 MHz (see Tables  
1 and 2 for additional reference clock frequencies) input used to  
establish the initial operating frequency of the clock recovery PLL and  
also used as a standby clock in the absence of data, during reset, or  
when SDN is inactive. Internally biased.  
Internally  
Biased  
Diff.  
REFCLKP  
REFCLKN  
6
7
I
LVPECL  
CAP1  
CAP2  
40 Loop Filter Capacitor. The external loop filter capacitor and resistors  
39 are connected to these pins. (See Figure 11.)  
I
I
Lock to Reference. Active Low. When active, the serial data output will  
LCKREFN  
LVTTL  
17  
be invalid.  
Test input signal used for production test. Leave open (no DC  
connection) for normal operation.  
TESTCLK  
REFSEL  
RST  
LVTTL  
LVTTL  
LVTTL  
I
I
I
15  
18 Selects the reference frequency (See Tables 1 and 2.)  
Active High. Resets lock detect circuit and VCO divide-by-N circuit for  
production test.  
16  
Test Enable. Active High. Bypasses the VCO for production test. Tie  
Low for normal operation.  
TESTEN  
LVTTL  
I
47  
SERDATOP  
SERDATON  
Diff.  
CML  
28 Serial Data Out. This signal is the delayed version of the incoming data  
27 stream (SERDATI).  
O
Lock Detect. Clock recovery indicator. Set High when the internal clock  
10 recovery has locked onto the incoming data stream. LOCKDET is an  
asynchronous output.  
LOCKDET  
LVTTL  
O
TESTOUT1  
TESTOUT2  
TESTMODE1  
TESTMODE2  
O
O
I
23 Test Output. Leave open (no DC connection) for normal operation.  
33 Test Output. Leave open (no DC connection) for normal operation.  
19 Test Mode Control. Keep High for normal operation.  
LVTTL  
LVTTL  
I
20 Test Mode Control. Keep High for normal operation.  
July 10, 2000 / Revision A  
5