QT2022/32 - Data Sheet: DS3051
Table 73: AC Boundary Scan Test Receiver Specifications for XAUI inputs (as per IEEE 1149.6)
1149.6
Reference
Parameter
Description
Min
Typ
Max
Units
Notes
dV
Valid input swing (see 1149.6
Fig. 40)
6.2.1.1Rule b, c
6.2.1.1Rule b
300
800
mV
Min is assumed 80% of
driver min
Ttrans
10-90% transition time (see
1149.6 Fig. 40)
330
ps
V
Max based on XAUI driver
sim with 50cm FR4
Ttrans_max corresponds
with dVmin
Vthreshold
Vhyst_level
Thyst
Threshold voltage in level-
detection mode
6.2.2.1Rule a
6.2.2.1Rule a
6.2.2.1Rule b
0.9
cm bias of input receiver
Hysteresis voltage offset in
level-detection mode
see
note
Same as Vhyst_edge
Hysteresis delay
1.0
10
ns
Thyst_min corresponds with
dVmax
Thyst_max corresponds with
dVmin
Vhyst_edge
HP_mult
Hysteresis voltage offset in
edge-detection mode
6.2.3.1 Rule b
6.2.3.1Rule i
100
25
224
270
mV
X
high-pass filter multiplier
From Table 3 in 1149.6.
no low-pass filter
Assuming Vhyst/dVmin=0.9
max
Thp
Chp
high-pass time constant
6.2.3.1Rule f
6.2.3.1Rule k
250
ns
HP_mult * Thyst_max
high-pass AC coupling cap
6.25
nF
Assuming 40ohms min
termination
Ttest/Thp
Ttest
Test pulsewidth multiplier for
AC (edge-det) mode
3
X
Test period for AC (edge-det)
mode
6.2
1500
ns
assuming Chp=10nF,
Thp=500ns
Fig 40 in 1149.6.
NOTE TCKperiod can be
much shorter than Ttest for
EXTEST_PULSE
TCKperiod/
Thp
TCK period multiplier for level-
det mode
2
X
5*Thp = 2.5*TCKperiod
TCKperiod
TCK period for level-det mode
6.2
1000
ns
assuming Chp=10nF,
Thp=500ns
Fig 42 in 1149.6.
TCKfreq
TCK frequency for level-det
mode
1
MHz
assuming Chp=10nF,
Thp=500ns
Note: It is assumed that XAUI inputs are always AC coupled, permitting implementation of IEEE1149.6 section
Revision 5.11
AppliedMicro - Confidential & Proprietary
201
AMCC [ APPLIED MICRO CIRCUITS CORPORATION ]
