欢迎访问ic37.com |
会员登录 免费注册
发布采购

EPM570T100C5N 参数 Datasheet PDF下载

EPM570T100C5N图片预览
型号: EPM570T100C5N
PDF下载: 下载PDF文件 查看货源
内容描述: 第一节MAX II器件系列数据手册 [Section I. MAX II Device Family Data Sheet]
分类和应用: 可编程逻辑输入元件
文件页数/大小: 101 页 / 1022 K
品牌: ALTERA [ ALTERA CORPORATION ]
 浏览型号EPM570T100C5N的Datasheet PDF文件第1页浏览型号EPM570T100C5N的Datasheet PDF文件第2页浏览型号EPM570T100C5N的Datasheet PDF文件第4页浏览型号EPM570T100C5N的Datasheet PDF文件第5页浏览型号EPM570T100C5N的Datasheet PDF文件第6页浏览型号EPM570T100C5N的Datasheet PDF文件第7页浏览型号EPM570T100C5N的Datasheet PDF文件第8页浏览型号EPM570T100C5N的Datasheet PDF文件第9页  
Features  
Low-cost, low-power CPLD  
Instant-on, non-volatile architecture  
Standby current as low as 2 mA  
Provides fast propagation delay and clock-to-output times  
Provides four global clocks with two clocks available per logic array  
block (LAB)  
Features  
UFM block up to 8 Kbits for non-volatile storage  
MultiVolt core enabling external supply voltages to the device of  
either 3.3 V/2.5 V or 1.8 V  
MultiVolt I/O interface supporting 3.3-V, 2.5-V, 1.8-V, and 1.5-V logic  
levels  
Bus-friendly architecture including programmable slew rate, drive  
strength, bus-hold, and programmable pull-up resistors  
Schmitt triggers enabling noise tolerant inputs (programmable per  
pin)  
Fully compliant with the Peripheral Component Interconnect Special  
Interest Group (PCI SIG) PCI Local Bus Specification, Revision 2.2 for  
3.3-V operation at 66 MHz  
Supports hot-socketing  
Built-in Joint Test Action Group (JTAG) boundary-scan test (BST)  
circuitry compliant with IEEE Std. 1149.1-1990  
ISP circuitry compliant with IEEE Std. 1532  
Table 1–1 shows MAX II device features.  
Table 1–1. MAX II Device Features  
Feature EPM240  
EPM570  
EPM1270  
EPM2210  
LEs  
240  
192  
570  
440  
1,270  
980  
2,210  
1,700  
Typical Equivalent  
Macrocells  
Equivalent Macrocell  
Range  
128 to 240  
240 to 570  
570 to 1,270  
1,270 to 2,210  
UFM Size (bits)  
Maximum User I/O pins  
tPD1 (ns) (1)  
8,192  
80  
8,192  
160  
5.4  
8,192  
212  
6.2  
8,192  
272  
7.0  
4.7  
f
t
t
CNT (MHz) (2)  
SU (ns)  
304  
1.7  
304  
1.2  
304  
1.2  
304  
1.2  
CO (ns)  
4.3  
4.5  
4.6  
4.6  
Notes to Table 1–1:  
(1) tPD1 represents a pin-to-pin delay for the worst case I/O placement with a full diagonal path across the device and  
combinational logic implemented in a single LUT and LAB that is adjacent to the output pin.  
(2) The maximum frequency is limited by the I/O standard on the clock input pin. The 16-bit counter critical delay  
will run faster than this number.  
1–2  
Core Version a.b.c variable  
Altera Corporation  
December 2006  
MAX II Device Handbook, Volume 1  
 复制成功!