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EPM1270GT144I4N 参数 Datasheet PDF下载

EPM1270GT144I4N图片预览
型号: EPM1270GT144I4N
PDF下载: 下载PDF文件 查看货源
内容描述: [Flash PLD, 8.1ns, 980-Cell, CMOS, PQFP144, 22 X 22 MM, 0.50 MM PITCH, LEAD FREE, TQFP-144]
分类和应用: LTE输入元件可编程逻辑
文件页数/大小: 108 页 / 1342 K
品牌: ALTERA [ ALTERA CORPORATION ]
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JTAG and In-System Programmability  
Design Security  
All MAX II devices contain a programmable security bit that controls  
access to the data programmed into the CFM block. When this bit is  
programmed, design programming information, stored in the CFM  
block, cannot be copied or retrieved. This feature provides a high level of  
design security because programmed data within flash memory cells is  
invisible. The security bit that controls this function, as well as all other  
programmed data, is reset only when the device is erased. The SRAM is  
also invisible and cannot be accessed regardless of the security bit setting.  
The UFM block data is not protected by the security bit and is accessible  
through JTAG or logic array connections.  
Programming with External Hardware  
MAX II devices can be programmed by downloading the information via  
®
in-circuit testers, embedded processors, the Altera ByteblasterMV™,  
MasterBlaster™, ByteBlaster™ II, and USB-Blaster cables.  
BP Microsystems, System General, and other programming hardware  
manufacturers provide programming support for Altera devices. Check  
their websites for device support information.  
This chapter references the following documents:  
Referenced  
Documents  
DC and Switching Characteristics chapter in the MAX II Device  
Handbook  
IEEE 1149.1 (JTAG) Boundary-Scan Testing for MAX II Devices  
chapter in the MAX II Device Handbook  
Real-Time ISP and ISP Clamp for MAX II Devices chapter in the  
MAX II Device Handbook  
Using Jam STAPL for ISP via an Embedded Processor chapter in the  
MAX II Device Handbook  
Altera Corporation  
December 2007  
Core Version a.b.c variable  
3–9  
MAX II Device Handbook, Volume 1  
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