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EP1SGX40GF1020I6N 参数 Datasheet PDF下载

EP1SGX40GF1020I6N图片预览
型号: EP1SGX40GF1020I6N
PDF下载: 下载PDF文件 查看货源
内容描述: [Field Programmable Gate Array, 4697 CLBs, 41250-Cell, CMOS, PBGA1020, 33 X 33 MM, 1 MM PITCH, LEAD FREE, FBGA-1020]
分类和应用: 可编程逻辑
文件页数/大小: 279 页 / 3682 K
品牌: ALTERA [ ALTERA CORPORATION ]
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Configuration & Testing  
Local Update Mode  
Local update mode is a simplified version of the remote update. This  
feature is intended for simple systems that need to load a single  
application configuration immediately upon power-up without loading  
the factory configuration first. Local update designs have only one  
application configuration to load, so it does not require a factory  
configuration to determine which application configuration to use.  
Figure 5–3 shows the transition diagram for local update mode.  
Figure 5–3. Local Update Transition Diagram  
Power-Up  
or nCONFIG  
nCONFIG  
Application  
Configuration  
Configuration  
Error  
nCONFIG  
Configuration  
Error  
Factory  
Configuration  
Stratix GX devices offer on-chip circuitry for automated checking of  
single event upset (SEU) detection. Some applications that require the  
device to operate error free at high elevations or in close proximity to  
earth’s North or South Pole require periodic checks to ensure continued  
data integrity. The error detection cyclic redundancy code (CRC) feature  
controlled by the Device & Pin Options dialog box in the Quartus II  
software uses a 32-bit CRC circuit to ensure data reliability and is one of  
the best options for mitigating SEU.  
Stratix GX  
Automated  
Single Event  
Upset (SEU)  
Detection  
Altera Corporation  
February 2005  
5–7  
Stratix GX Device Handbook, Volume 1  
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