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EP1AGX 参数 Datasheet PDF下载

EP1AGX图片预览
型号: EP1AGX
PDF下载: 下载PDF文件 查看货源
内容描述: 第一节的Arria GX器件数据手册 [Section I. Arria GX Device Data Sheet]
分类和应用:
文件页数/大小: 234 页 / 3509 K
品牌: ALTERA [ ALTERA CORPORATION ]
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3–2  
Chapter 3: Configuration and Testing  
IEEE Std. 1149.1 JTAG Boundary-Scan Support  
Table 3–1. Arria GX JTAG Instructions  
JTAG Instruction  
Instruction Code  
Description  
SAMPLE/PRELOAD  
00 0000 0101  
Allows a snapshot of signals at the device pins to be captured  
and examined during normal device operation and permits an  
initial data pattern to be output at the device pins. Also used by  
the SignalTap II embedded logic analyzer.  
EXTEST (1)  
00 0000 1111  
11 1111 1111  
Allows external circuitry and board-level interconnects to be  
tested by forcing a test pattern at the output pins and capturing  
test results at the input pins.  
BYPASS  
Places the 1-bit bypass register between the TDIand TDOpins,  
which allows the BST data to pass synchronously through  
selected devices to adjacent devices during normal device  
operation.  
USERCODE  
00 0000 0111  
Selects the 32-bit USERCODEregister and places it between the  
TDIand TDOpins, allowing the USERCODEto be serially shifted  
out of TDO.  
IDCODE  
00 0000 0110  
00 0000 1011  
Selects the IDCODEregister and places it between TDIand TDO,  
allowing IDCODEto be serially shifted out of TDO.  
HIGHZ (1)  
Places the 1-bit bypass register between the TDIand TDOpins,  
which allows the BST data to pass synchronously through  
selected devices to adjacent devices during normal device  
operation, while tri-stating all of the I/O pins.  
CLAMP (1)  
00 0000 1010  
Places the 1-bit bypass register between the TDIand TDOpins,  
which allows the BST data to pass synchronously through  
selected devices to adjacent devices during normal device  
operation while holding I/O pins to a state defined by the data in  
the boundary-scan register.  
ICR instructions  
Used when configuring an Arria GX device via the JTAG port with  
a USB-BlasterTM, MasterBlasterTM, ByteBlasterMVTM  
,
EthernetBlasterTM, or ByteBlaster II download cable, or when  
using a .jam or .jbc via an embedded processor or JRunnerTM.  
PULSE_NCONFIG  
00 0000 0001  
00 0000 1101  
Emulates pulsing the nCONFIGpin low to trigger  
reconfiguration even though the physical pin is unaffected.  
CONFIG_IO (2)  
Allows configuration of I/O standards through the JTAG chain for  
JTAG testing. Can be executed before, during, or after  
configuration. Stops configuration if executed during  
configuration. Once issued, the CONFIG_IOinstruction holds  
nSTATUSlow to reset the configuration device. nSTATUSis  
held low until the IOE configuration register is loaded and the  
TAP controller state machine transitions to the UPDATE_DR  
state.  
Notes to Table 3–1:  
(1) Bus hold and weak pull-up resistor features override the high-impedance state of HIGHZ, CLAMP, and EXTEST.  
(2) For more information about using the CONFIG_IOinstruction, refer to the MorphIO: An I/O Reconfiguration Solution for Altera Devices  
White Paper.  
Arria GX Device Handbook, Volume 1  
© December 2009 Altera Corporation