ASM5P23S09A
ASM5P23S05A
November 2004
rev 1.3
Switching Characteristics for ASM5I23S05A-1H and ASM5I23S09A-1H Industrial Temperature Devices7
Parameter
Description
Output Frequency
Test Conditions
Min
Typ
Max
Unit
1/t1
30 pF load
10 pF load
15
15
100
133
MHz
Duty Cycle 9 = (t2 / t1) * 100
Duty Cycle 9 = (t2 / t1) * 100
Output Rise Time 9
Measured at 1.4 V, FOUT = 66.67 MHz
Measured at 1.4 V, FOUT < 50.0 MHz
Measured between 0.8V and 2.0V
Measured between 2.0V and 0.8V
All outputs equally loaded
40.0
45.0
50.0
50.0
60.0
55.0
1.50
1.50
250
%
t3
t4
t5
t6
nS
nS
pS
pS
Output Fall Time 9
Output-to-output skew 9
Delay, REF Rising Edge to
CLKOUT Rising Edge 9
Device-to-Device Skew 9
Measured at VDD /2
0
0
± 350
t7
t8
Measured at VDD/2 on the CLKOUT
pins of the device
700
pS
V/nS
pS
Output Slew Rate 9
Cycle-to-cycle jitter 9
PLL Lock Time 9
Measured between 0.8V and 2.0V
using Test Circuit #2
1
tJ
Measured at 66.67 MHz, loaded
outputs
200
1.0
tLOCK
Stable power supply, valid clock pre
sented on REF pin
mS
Note:
9. Parameter is guaranteed by design and characterization. Not 100% tested in production
3.3V ‘SpreadTrak’ Zero Delay Buffer
8 of 18
Notice: The information in this document is subject to change without notice.
ALSC [ ALLIANCE SEMICONDUCTOR CORPORATION ]
