AS29CF160T-55TIN
AS29CF160B-55TIN
Test Conditions
Test Specifications
Test Condition
-55
1 TTL gate
Unit
Output Load
Output Load Capacitance, CL (including jig capacitance)
Input Rise and Fall Times
30
5
pF
ns
V
Input Pulse Levels
0.0 - 3.0
1.5
Input timing measurement reference levels
Output timing measurement reference levels
V
1.5
V
Test Setup
5.0 V
2.7 K
Ω
Device
Under
Test
Diodes = IN3064 or Equivalent
CL
6.2 K
Ω
Confidential
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Rev.1.0 July 2019