Dual Differential Transceiver BTF1A
With Idle Bus Indicator
Data Sheet
March 2001
Handling Precautions
CAUTION: This device is susceptible to damage as a result of ESD. Take proper precautions during both
handling and testing. Follow guidelines such as JEDEC Publication No. 108-A (Dec. 1988).
When handling and mounting line driver products, proper precautions should be taken to avoid exposure to ESD.
The user should adhere to the following basic rules for ESD control:
1. Assume that all electronic components are sensitive to ESD damage.
2. Never touch a sensitive component unless properly grounded.
3. Never transport, store, or handle sensitive components except in a static-safe environment.
ESD Failure Models
Lucent employs two models for ESD events that can cause device damage or failure:
1. A human body model (HBM) that is used by most of the industry for ESD-susceptibility testing and protection-
design evaluation. ESD voltage thresholds are dependent on the critical parameters used to define the model.
A standard HBM (resistance = 1500
Ω,
capacitance = 100 pF) is widely used and, therefore, can be used for
comparison purposes.
2. A charged-device model (CDM), which many believe is the better simulator of electronics manufacturing expo-
sure.
testing is intended to simulate an ESD event from a charged person. The CDM ESD testing simulates charging and
discharging events that occur in production equipment and processes, e.g., an integrated circuit sliding down a
shipping tube.
The HBM ESD threshold voltage presented here was obtained by using these circuit parameters.
Table 8. Typical ESD Thresholds for Data Transmission Transceivers
Device
Differential Inputs
All Other Pins
HBM Threshold
>800
>2000
CDM Threshold
>1000
>1000
Table 9. ESD Damage Protection
ESD Threat Controls
Personnel
Control
Wrist straps
ESD shoes
Antistatic flooring
Human body model (HBM)
Processes
Static-dissipative materials
Air ionization
Charged-device model (CDM)
Model
12
Agere Systems Inc.
AGERE [ AGERE SYSTEMS ]
