4.0 DC ELECTRICAL CHARACTERISTICS (Pre/Post-Radiation)*
(VDD = 5.0V ±10% ) (TC = -55°C to +125°C for "C" screening and -40°C to +125°C for "W" screening)
SYMBOL
PARAMETER
CONDITION
MINIMUM
MAXIMUM UNIT
VIL
Low-level Input Voltage
(except XTAL1, RESET)
0.8
V
VIH
High-level Input Voltage
(except XTAL1, RESET)
2.2
V
V
VIH1
High-level Input Voltage
(XTAL1)
.7VDD
VIL1
VT+
VT-
Low-level Input Voltage
(XTAL1)
.3VDD
.7VDD
.4VDD
V
V
V
V
Positive Going Threshold
RESET
.5VDD
.2VDD
.9
Negative Going Threshold
RESET
Typical Range of Hysteresis6
RESET
VH
VOL
VOH
IOHI
Low-level Output Voltage
(CMOS load)
IOL = 200mA6
0.3
0.4
V
V
(TTL load)
IOL = 4.0mA
High-level Output Voltage8
(CMOS load)
IOH = -200mA6
VDD-.3
3.8
V
V
(Standard outputs) (TTL load)
IOH = -4.0mA
High-level Output Current1
(Open drain outputs with pullups)
VOH = VDD - .3
VOH = VDD - .9
(see Note 6)
-20
-60
mA
mA
Logical 0 Input Current2
(Test mode entry)
IIL
ILI
VIN = VIH
-550
-5
-120
+5
mA
mA
I/O Leakage Current, standard
inputs/outputs in Z state
VIN = VSS or VDD
I/O Leakage Current, with pullups3
I/O Leakage Current, with
pulldowns4
ILI1
ILI2
VIN = VSS
VIN = VDD
-800
200
-150
1500
mA
mA
Pin Capacitance6
CIO
@ 1MHZ, 25°C
15
pF
AIDD
Active Power Supply Current
Clk@20MHz, typical program
flow
110
mA
QIDD
Quiescent Power Supply Current Unloaded -55° to +25°C
Outputs, +125°C
20
1000
1000
6
mA
No Clock +25°C post-rad
IDDPD
Power Supply Current in Power
Down
No Active I/O, Clk@20MHz
mA
IDDIDLE Power Supply Current in Idle Mode No Active I/O, Clk@20MHZ
55
65
mA
mA
mA
IDDRESET Power Supply Current in Reset
CLK @20 MHz, RESET < VIL
IOS
Short Circuit output current (except VDD = 5.5V
for pins listed in Note 5)6,7
-100
-200
130
Short Circuit output current5,6,7
IOS1
VDD = 5.5V
250
mA
24
AEROFLEX [ AEROFLEX CIRCUIT TECHNOLOGY ]
