REVISIONS
LTR
A
B
DESCRIPTION
Add device type 02 tested at low dose rate. Make changes to paragraphs
1.2.2, 1.5, 4.4.1c, 4.4.4.1, Table I and figure 1. - ro
Add single event latchup (SEL) testing information. Delete device class M
references. - ro
DATE (YR-MO-DA)
12-02-08
13-06-13
APPROVED
C. SAFFLE
C. SAFFLE
REV
SHEET
REV
SHEET
REV STATUS
OF SHEETS
PMIC N/A
B
15
B
16
B
17
B
18
REV
SHEET
PREPARED BY
RICK OFFICER
B
1
B
2
B
3
B
4
B
5
B
6
B
7
B
8
B
9
B
10
B
11
B
12
B
13
B
14
STANDARD
MICROCIRCUIT
DRAWING
THIS DRAWING IS AVAILABLE
FOR USE BY ALL
DEPARTMENTS
AND AGENCIES OF THE
DEPARTMENT OF DEFENSE
CHECKED BY
RAJESH PITHADIA
APPROVED BY
CHARLES F. SAFFLE
DRAWING APPROVAL DATE
10-12-16
REVISION LEVEL
B
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
MICROCIRCUIT, LINEAR, HIGH VOLTAGE,
CURRENT SHUNT MONITOR, MONOLITHIC
SILICON
SIZE
A
CAGE CODE
AMSC N/A
67268
SHEET
1 OF 18
5962-09244
DSCC FORM 2233
APR 97
5962-E445-13
AD [ ANALOG DEVICES ]
