TABLE IIA. Electrical test requirements.
Subgroups
Test requirements
Subgroups
(in accordance with
(in accordance with
MIL-STD-883,
MIL-PRF-38535, table III)
method 5005, table I)
Device
class M
1, 4
Device
class Q
1, 4
Device
class V
1, 4
Interim electrical
parameters (see 4.2)
Final electrical
1, 2, 3, 4 1/
1, 2, 3, 4 1/
1, 2, 3, 4, 9
1/ 2/
parameters (see 4.2)
1, 2, 3, 4
1, 4
1, 2, 3, 4
1, 4
1, 2, 3, 4, 9
Group A test
requirements (see 4.4)
Group C end-point electrical
parameters (see 4.4)
Group D end-point electrical
parameters (see 4.4)
Group E end-point electrical
parameters (see 4.4)
1, 4 2/
1, 4
1, 4
1, 4
1, 4
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1/ PDA applies to subgroup 1. Delta's excluded from PDA.
2/ Delta limits as specified in table IIB shall be required where specified, and delta limits shall
be computed with reference to the previous endpoint electrical parameters.
Table IIB. 240 hour burn-in and group C end-point electrical parameters.
Parameter
RA
Device type
01
Limit
Delta
±0.5% FS
±0.1% FS
4.4.2 Group C inspection. The group C inspection end-point electrical parameters shall be as specified in table IIA herein.
4.4.2.1 Additional criteria for device class M. Steady-state life test conditions, method 1005 of MIL-STD-883:
a. Test condition B or C. The test circuit shall be maintained by the manufacturer under document revision level control
and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs,
outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-
STD-883.
b. TA = +125°C, minimum.
c. Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.
4.4.2.2 Additional criteria for device classes Q and V. The steady-state life test duration, test condition and test temperature,
or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The
test circuit shall be maintained under document revision level control by the device manufacturer's TRB in accordance with
MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the
inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-
STD-883.
SIZE
STANDARD
MICROCIRCUIT DRAWING
5962-90537
A
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
REVISION LEVEL
D
SHEET
8
DSCC FORM 2234
APR 97
ADI [ ADI ]
