MIL-PRF-38535K
APPENDIX C
RADIATION HARDNESS ASSURANCE
C.1 SCOPE
C.1.1 Scope. This appendix presents the requirements which are to be used to supplement MIL-PRF-38535 for device
manufacturers supplying radiation hardness assurance (RHA) microcircuits. This appendix is a mandatory part of the
specification. The information contained herein is intended for compliance.
C.2 APPLICABLE DOCUMENTS
C.2.1 General. The documents listed in this section are specified in sections C.3, C.4, or C.5 of this appendix. This section
does not include documents cited in other sections of this appendix or recommended for additional information or as examples.
While every effort has been made to ensure the completeness of this list, document users are cautioned that they must meet all
specified requirements of documents cited in sections C.3, C.4, and C.5 of this appendix, whether or not they are listed.
C.2.2 Government documents.
C.2.2.1 Specifications, standards, and handbooks. The following specifications, standards, and handbooks form a part of
this document to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the
solicitation or contract.
DEPARTMENT OF DEFENSE STANDARDS
MIL-STD-883
- Test Method Standard Microcircuits.
DEPARTMENT OF DEFENSE HANDBOOKS
MIL-HDBK-814 - Ionizing Dose and Neutron Hardness Assurance Guidelines for Microcircuits and Semiconductor
Devices.
MIL-HDBK-815 - Dose-Rate Hardness Assurance Guidelines.
(Copies of these documents are available online at http://quicksearch.dla.mil/ or from the Standardization Document Order
Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)
C.2.3 Non-Government publications. The following documents form a part of this document to the extent specified herein.
Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract.
ASTM INTERNATIONAL (ASTM)
ASTM F1192
ASTM F1892
- Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by
Heavy Ion Irradiation of Semiconductor Devices.
- Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor
Devices.
(Copies of these documents are available online at http://www.astm.org/ or from ASTM International, 100 Barr
Harbor Drive, P.O. Box C700, West Conshohocken, PA 19428-2959.)
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ACTEL [ Actel Corporation ]
