MIL-PRF-38535K
APPENDIX B
SPACE APPLICATION
B.1 SCOPE
B.1.1 Scope. This appendix presents the requirements that are to be used to supplement this specification and the other
applicable appendices for space level microcircuits. The manufacturer's process may include innovative and improved processes
that result in an equivalent or higher quality product, provided that the process used to evaluate and document these changes has
been reviewed and approved by the qualifying activity after coordination with the government space community (e.g., DTRA, NASA,
NRO, and AFSMC). The approach outlined in this appendix is a proven baseline that contains details of the screening and
technology conformance inspection (TCI) procedures. Manufacturers are to be able to demonstrate a process control system that
achieves at least the same level of quality as could be achieved by complying with this appendix. This appendix is intended for
product to be used in space applications. This appendix is a mandatory part of the specification. The information contained herein is
intended for compliance.
B.2 APPLICABLE DOCUMENTS.
B.2.1 General. The documents listed in this section are specified in sections B.3 or B.4 of this appendix. This section does not
include documents cited in other sections of this appendix or recommended for additional information or as examples. While every
effort has been made to ensure the completeness of this list, document users are cautioned that they must meet all specified
requirements of documents cited in sections B.3 and B.4 of this appendix, whether or not they are listed.
B.2.2 Government documents.
B.2.2.1 Specifications, standards, and handbooks. The following specifications, standards, and handbooks form a part of this
document to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation
or contract.
DEPARTMENT OF DEFENSE SPECIFICATIONS
MIL-M-38510
- Microcircuits, General Specification For.
DEPARTMENT OF DEFENSE STANDARDS
MIL-STD-883
- Test Method Standard Microcircuits.
(Copies of these documents are available online at http://quicksearch.dla.mil/ or from the Standardization Document Order Desk,
700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)
B.2.3 Non-Government publications. The following documents form a part of this document to the extent specified herein. Unless
otherwise specified, the issues of these documents are those cited in the solicitation or contract.
ASTM INTERNATIONAL (ASTM)
ASTM F1192
- Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion
Irradiation of Semiconductor Devices.
(Copies of these documents are available online at http://www.astm.org/ or from ASTM International, 100 Barr Harbor
Drive, P.O. Box C700, West Conshohocken, PA 19428-2959.)
102
ACTEL [ Actel Corporation ]
