MIL-PRF-38535K
6.8 List of acronyms.
AQL
ANSI
ASIC
ASTM
BV
- acceptable quality level
- American National Standards Institute
- application specific integrated circuit
- American Society for Testing and Materials
- breakdown voltage
CAD
CAGE
CMOS
CSAM
CSI
- computer aided design
- Commercial and Government Entity
- complementary metal oxide semiconductor
- C-mode scanning acoustical microscopy
- contractor source inspection
- design-for-test
DFT
DMS
DRC
DSCC
DTL
- diminishing manufacturing sources
- design rules check
- Defense Supply Center, Columbus
- diode transistor logic
ECL
- emitter coupled logic
EEE
EIA
- electrical, electronic, and electromechanical
- Electronic Industries Alliance
- enhanced low dose rate sensitivity
- epitaxial
ELDRS
EPI
ERC
ESD
FA
- electrical rules check
- electrostatic discharge
- failure analysis
FET
- field effect transistor
FIFO
FSC
GaAs
GCR
GIDEP
gm
- first in, first out
- federal stock class
- gallium arsenide
- galactic cosmic rays
- Government - Industry Data Exchange Program
- linear transconductance
GSI
- Government Source Inspection
- Highly accelerated temperature and humidity stress test
- high-speed CMOS
HAST
HCMOS
HDBK
IC
- handbook
- integrated circuit
ILB
- inner lead bond
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ACTEL [ Actel Corporation ]
