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5962-0422104QUC 参数 Datasheet PDF下载

5962-0422104QUC图片预览
型号: 5962-0422104QUC
PDF下载: 下载PDF文件 查看货源
内容描述: [Field Programmable Gate Array, 2000000 Gates, 32256-Cell, CMOS, CQFP256, CERAMIC, QFP-256]
分类和应用: 可编程逻辑
文件页数/大小: 217 页 / 1554 K
品牌: ACTEL [ Actel Corporation ]
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MIL-PRF-38535K  
FIGURE 1. The QML manufacturing line.  
FIGURE 2. Combinations of a manufacturing line.  
QM does not stop with a manufacturer listed on the QML. This specification identifies the necessary screens which QML  
devices are to be capable of meeting. These screens can be reduced or changed by the manufacturers' TRB when gathered  
reliability data on the technology indicates that such changes are substantiated. The philosophy of generic qualification  
incorporates the idea that high quality and reliable microcircuits can be obtained without excessive testing if the processes are  
properly monitored and controlled at each step of the manufacturing line. The following describes the monitors and controls  
that may be used.  
a. The design procedure and tools are controlled in such a manner that the ensuing microcircuit design performs only  
with limits that have been shown to be reliable for the technology being used, within the constraints of established  
design rules (electrical, geometric and reliability).  
b. The mask fabrication facility is controlled such that an error free mask is produced from the microcircuit design  
database. Monitoring, controlling and reducing defect density is helpful in obtaining error free masks.  
c. The wafer fabrication process is controlled with the following: Use of in-line statistical control; a parametric monitor  
structure for measuring electrical parameters; a TCV structure to study intrinsic reliability mechanisms; and a SEC to  
monitor the fabrication process and to serve as a surrogate microcircuit for reliability testing.  
d. The package and assembly facility is controlled with emphasis on in-line statistical process control of all assembly  
steps.  
e. The test area controls consist of test equipment accuracy and calibration as well as a controlled interface to the  
microcircuit design center.  
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