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5962-0151801QYC 参数 Datasheet PDF下载

5962-0151801QYC图片预览
型号: 5962-0151801QYC
PDF下载: 下载PDF文件 查看货源
内容描述: [Field Programmable Gate Array, 32000 Gates, 206MHz, 2880-Cell, CMOS, CQFP208, CERAMIC, QFP-208]
分类和应用: 可编程逻辑
文件页数/大小: 217 页 / 1554 K
品牌: ACTEL [ Actel Corporation ]
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MIL-PRF-38535K  
APPENDIX C  
TABLE C-I. Group E (RHA) TCI/QCI test for class Q, class V and class Y.  
MIL-STD-883 test method and conditions  
Minimum sample size quantity (accept no.)  
Tests  
1/ 2/  
Subgroups  
Class Q  
Class V  
Class Y  
(class level B)  
(class level S)  
(class level S)  
Subgroup 1  
Neutron irradiation test  
(Displacement Damage test)  
a. Qualification test  
3/ 4/  
a.TM 1017 at 25°C  
2(0) devices/wafer or  
5(0) devices/wafer lot or  
11(0) devices/inspection lot  
5/  
a.TM 1017 at 25°C  
2(0) devices/wafer or  
11(0) devices/wafer lot 6/  
a.TM 1017 at 25°C  
2(0) devices/wafer or  
11(0) devices/wafer lot 6/  
b. QCI/TCI test  
b. TM 1017 at 25°C  
2(0) devices/wafer or  
5(0) devices/wafer lot or  
11(0) devices/inspection lot  
5/  
b. TM 1017 at 25°C  
2(0) devices/wafer or  
11(0) devices/wafer lot 6/  
b. TM 1017 at 25°C  
2(0) devices/wafer or  
11(0) devices/wafer lot 6/  
c. Endpoint electrical  
parameters test  
c. As specified in  
accordance with device  
specification  
c. As specified in  
accordance with  
device specification  
c. As specified in  
accordance with  
device specification  
Subgroup 2  
3/ 7/ 9/ 10/  
Total ionization dose (TID)  
a. Qualification test  
a. TM 1019 at 25°C  
a.TM 1019 at 25°C  
a.TM 1019 at 25°C  
maximum supply voltage  
2(0) devices/wafer or  
5(0) devices/wafer lot or  
maximum supply voltage  
2(0) devices/wafer or  
22(0) devices/wafer lot or  
maximum supply voltage  
2(0) devices/wafer or  
22(0) devices/wafer lot or  
1(0) devices/wafer +  
22(0) devices/inspection lot 1(0) devices/wafer +  
8/  
4(0) SEC or test structures/ 4(0) SEC or test structures/  
wafer or  
wafer or  
5(0)devices/wafer lot +  
5(0)devices/wafer lot +  
4(0) SEC or test structures/ 4(0) SEC or test structures/  
wafer  
wafer  
b. TM 1019 at 25°C  
b.TM 1019 at 25°C  
b.TM 1019 at 25°C  
b. QCI/TCI test  
maximum supply voltage  
2(0) devices/wafer or  
5(0) devices/wafer lot or  
maximum supply voltage  
2(0) devices/wafer or  
22(0) devices/wafer lot or  
maximum supply voltage  
2(0) devices/wafer or  
22(0) devices/wafer lot or  
1(0) devices/wafer +  
22(0) devices/inspection lot 1(0) devices/wafer +  
8/  
4(0) SEC or test structures/ 4(0) SEC or test structures/  
wafer or  
wafer or  
5(0)devices/wafer lot +  
5(0)devices/wafer lot +  
4(0) SEC or test structures/ 4(0) SEC or test structures/  
wafer  
wafer  
c. As specified in  
accordance with device  
specification  
c. As specified in  
accordance with device  
specification  
c. As specified in  
accordance with device  
specification  
c. Endpoint electrical  
parameters test  
116  
 
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