WCFS1016V1C
Maximum Ratings
(Above which the useful life may be impaired. For user guide-
lines, not tested.)
Storage Temperature ................................. –65°C to +150°C
Ambient Temperature with
Power Applied............................................. –55°C to +125°C
Supply Voltage on V
CC
to Relative GND
[1]
.... –0.5V to +4.6V
DC Voltage Applied to Outputs
in High Z State
[1]
......................................–0.5V to V
CC
+0.5V
DC Input Voltage
[1]
...................................–0.5V to V
CC
+0.5V
Current into Outputs (LOW) ........................................ 20 mA
Static Discharge Voltage............................................ >2001V
(per MIL-STD-883, Method 3015)
Latch-Up Current..................................................... >200 mA
Operating Range
Range
Commercial
Ambient Temperature
[2]
0°C to +70°C
V
CC
3.3V
±
10%
Electrical Characteristics
Over the Operating Range
Test Conditions
Parameter
V
OH
V
OL
V
IH
V
IL
I
IX
I
OZ
I
CC
Description
Output HIGH
Voltage
Output LOW
Voltage
Input HIGH
Voltage
Input LOW
Voltage
[1]
Input Load
Current
Output Leakage
Current
V
CC
Operating
Supply Current
Automatic CE
Power-Down
Current
—TTL Inputs
Automatic CE
Power-Down
Current
—CMOS Inputs
GND < V
I
< V
CC
GND < V
I
< V
CC
,
Output Disabled
V
CC
= Max.,
I
OUT
= 0 mA,
f = f
MAX
= 1/t
RC
Max. V
CC
,
CE > V
IH
V
IN
> V
IH
or
V
IN
< V
IL
, f = f
MAX
Max. V
CC
,
CE > V
CC
– 0.3V,
V
IN
> V
CC
– 0.3V,
or V
IN
< 0.3V,
f=0
V
CC
= Min.,
I
OH
= –4.0 mA
V
CC
= Min., I
OL
= 8.0 mA
2.2
–0.3
–1
–1
WCFS1016V1C 12ns
Min.
2.4
Max.
Unit
V
0.4
V
CC
+ 0.3V
0.8
+1
+1
150
V
V
V
µA
µA
mA
I
SB1
40
mA
I
SB2
5
mA
Capacitance
Parameter
C
IN
C
OUT
Description
Input Capacitance
Output Capacitance
Test Conditions
T
A
= 25°C, f = 1 MHz
Max.
6
8
Unit
pF
pF
Note:
1. V
IL
(min.) = –2.0V for pulse durations of less than 20 ns.
2. T
A
is the “instant on” case temperature.
3. Tested initially and after any design or process changes that may affect these parameters.
Page 2 of 9
WEIDA [ WEIDA SEMICONDUCTOR, INC. ]
