CY28329
Switching Characteristics Over the Operating Range[8]
Parameter
t1
t2
Output
Description
Output Duty Cycle[9]
Rise Time
Test Conditions
Measured at 1.5V
Min.
45
Max.
55
Unit
%
All
CPU
Measured differential waveform from
–0.35V to +0.35V
175
700
ns
t2
USB, REF,
DOT
Rising Edge Rate
Between 0.4V and 2.4V
0.5
2.0
ns
t2
t3
PCI, 3V66
CPU
Rising Edge Rate
Fall Time
Between 0.4V and 2.4V
1.0
4.0
V/ns
ps
Measured differential waveform from
–0.35V to +0.35V
175
700
t3
USB, REF,
DOT
Falling Edge Rate
Between 2.4V and 0.4V
0.5
1.0
2.0
ns
t3
t4
t5
t5
t6
t7
t8
PCI, 3V66
CPU
Falling Edge Rate
CPU-CPU Skew
Between 2.4V and 0.4V
Measured at Crossover
Measured at 1.5V
4.0
150
500
175
500
3.5
V/ns
ps
3V66 [0:1]
66BUFF[0:2]
PCI
3V66-3V66 Skew
ps
66BUFF-66BUFF Skew
PCI-PCI Skew
Measured at 1.5V
ps
Measured at 1.5V
ps
3V66, PCI
CPU
3V66-PCI Clock Skew
Cycle-Cycle Clock Jitter
3V66 leads. Measured at 1.5V
1.5
ns
Measured at Crossover t8 = t8A – t8B
With all outputs running
150
ps
t9
3V66
USB, DOT
PCI
Cycle-Cycle Clock Jitter
Cycle-Cycle Clock Jitter
Cycle-Cycle Clock Jitter
Cycle-Cycle Clock Jitter
POR timing
Measured at 1.5V t9 = t9A – t9B
Measured at 1.5V t9 = t9A – t9B
Measured at 1.5V t9 = t9A – t9B
Measured at 1.5V t9 = t9A – t9B
Measured at 1.5V[10, 11]
250
350
500
1000
4.0
ps
ps
ps
ps
ms
mV
V
t9
t9
t9
REF
t10
ALL
1.0
CPU
Rise/Fall Matching
Measured with test loads[12, 13]
Measured with test loads[13]
235
1.45
Voh
Vol
CPU
High-level Output Voltage
including overshoot
0.92
–0.2
CPU
CPU
Low-level Output Voltage
including undershoot
Measured with test loads[13]
Measured with test loads[13]
0.35
V
V
Vcrossover
Crossover Voltage
0.250 0.550
Notes:
8. All parameters specified with loaded outputs.
9. Duty cycle is measured at 1.5V when V = 3.3V. When V = 2.5V, duty cycle is measured at 1.25V.
10. POR starts when V reaches 1.5V.
DD
DD
DD
11. All PULL-UPs must ramp at the same rate as V
.
DD
12. Determined as a fraction of 2*(Trp – Trn)/(Trp +Trn) Where Trp is a rising edge and Trn is an intersecting falling edge.
13. The test load is R = 33.2:, R = 49.9: in test circuit.
s
p
Rev 1.0,November 24, 2006
Page 8 of 16