ML696201 and ML69Q6203
Preliminary
Pin Descriptions
Primary/
Symbol
I/O
Description
Secondary
System
OSC32K0
OSC32K1B
OSC48M0
I
O
I
32-kHz oscillation input
32-kHz oscillation output
48-MHz oscillation input
48-MHz oscillation output
11-MHz oscillation input
11-MHz oscillation output
System Reset (Active-Low)
—
—
—
—
—
—
—
OSC48M1B
OSC11M0
OSC11M1B
RESET_N
Mode
O
I
O
I
BOOT[1:0]
I
Controls boot devices
—
BOOT[1]
BOOT[0]
Boot Device
0
0
1
1
0
1
0
1
MCP Flash
External Flash
AHBROM
AHBROM
EXTBUS
I
I
I
Switches between external bus pin and GPIO.
—
—
EXTBUS
GPIO/External bus
0
1
GPIO0
External Bus
IDEMODE
Switches between IDE and NAND Flash pin
IDEMODE
NAND Flash/IDE controller
NAND Flash
0
1
IDE controller
PLLBYPASS
TEST_BS
Sets PLL bypass mode
PLLBYPASS
—
—
—
PLL Mode
0
1
Use PLL
Bypass PLL – connect to GND
Sets Boundary Scan mode – The TEST_BS pin can be set to active only when boundary scan is used.
TEST_BS
Boundary SCAN mode
Normal Mode
Boundary SCAN mode
0
1
TMODE [3:0]
I
These pins are used to switch test modes such as SCAN, TIC, JTAG-Flash, AUDIO A/D and D/A, and PLL.
Always set TMODE to GND level.
RTC_TESTMODE
32K_TESTMODE
Debug Support
TCK
I
I
This pin switches the Scan mode pin of the RTC section.
—
—
This pin switches the test mode pin of a 32-kHz oscillator circuit.
I
I
I
This pin is used during debugging. Normally connect this pin to GND.
This pin is used during debugging. Normally set this input High
—
—
—
TMS
nTRST
This pin is used during debugging. Normally connect this pin to GND. (n = Active Low)
8 • Oki Semiconductor