CY7C375i
Electrical Characteristics Over the Operating Range[3, 4]
Parameter
Description
Test Conditions
VCC = Min. IOH = –3.2 mA (Com’l/Ind)[5]
IOH = –2.0 mA (Mil)
Min. Typ. Max. Unit
VOH
Output HIGH Voltage
2.4
V
V
VOHZ
VOL
Output HIGH Voltage
with Output Disabled[9]
VCC = Max. IOH = 0 µA (Com’l/Ind)[5, 6]
IOH = –50 µA (Com’l/Ind)[5, 6]
VCC = Min. IOL = 16 mA (Com’l/Ind)[5]
IOL = 12 mA (Mil)
4.0
3.6
0.5
V
V
Output LOW Voltage
V
V
VIH
VIL
IIX
Input HIGH Voltage
Input LOW Voltage
Input Load Current
Guaranteed Input Logical HIGH voltage for all inputs[7] 2.0
Guaranteed Input Logical LOW voltage for all inputs[7] –0.5
7.0
0.8
V
V
VI = Internal GND, VI = VCC
–10
+10
µA
µA
µA
mA
IOZ
Output Leakage Current VCC = Max., VO = GND or VO = VCC, Output Disabled –50
+50
VCC = Max., VO = 3.3V, Output Disabled[6]
0
–70 –125
–160
IOS
ICC
Output Short
VCC = Max., VOUT = 0.5V
–30
Circuit Current[8, 9]
Power Supply
Current[10]
VCC = Max., IOUT = 0 mA,
f = 1 MHz, VIN = GND, VCC
Com’l/Ind.
125
75
200
125
250
mA
mA
mA
µA
Com’l “L” –66
Military
125
IBHL
Input Bus Hold LOW
Sustaining Current
VCC = Min., VIL = 0.8V
VCC = Min., VIH = 2.0V
VCC = Max.
+75
IBHH
Input Bus Hold HIGH
Sustaining Current
–75
µA
µA
µA
IBHLO
IBHHO
Input Bus Hold LOW
Overdrive Current
+500
Input Bus Hold HIGH
Overdrive Current
VCC = Max.
–500
Capacitance[9]
Parameter
Description
Test Conditions
Min.
Max.
Unit
[11]
CI/O
Input/Output Capacitance
Clock Signal Capacitance
VIN = 5.0V at f=1 MHz
VIN = 5.0V at f = 1 MHz
8
pF
pF
CCLK
5
12
Notes:
3. See the last page of this specification for Group A subgroup testing information.
4. If VCCIO is not specified, the device can be operating in either 3.3V or 5V I/O mode; VCC=VCCINT
.
5. IOH = –2 mA, IOL = 2 mA for SDO.
6. When the I/O is three-stated, the bus-hold circuit can weakly pull the I/O to a maximum of 4.0V if no leakage current is allowed. This voltage is lowered significantly
by a small leakage current. Note that all I/Os are three-stated during ISR programming. Refer to the application note “Understanding Bus Hold” for additional
information.
7. These are absolute values with respect to device ground. All overshoots due to system or tester noise are included.
8. Not more than one output should be tested at a time. Duration of the short circuit should not exceed 1 second. VOUT = 0.5V has been chosen to avoid test
problems caused by tester ground degradation.
9. Tested initially and after any design or process changes that may affect these parameters.
10. Measured with 16-bit counter programmed into each logic block.
11. CI/O for dedicated inputs, and for I/O pins with JTAG functionality is 12 pF,and for the ISREN pin is 15 pF Max.
Document #: 38-03029 Rev. **
Page 6 of 17
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