A Business Partner of Renesas Electronics Corporation.
NE5550279A
TEST CIRCUIT SCHEMATIC FOR 460 MHz
VGS
VDS
R1
C1
L1
C1
IN
50 Ω
OUT
50 Ω
C10
L2
L3
L4
C22
C13
C14
FET
NE5550279A
C20
C11
C12
C21
COMPONENTS OF TEST CIRCUIT FOR MEASURING ELECTRICAL CHARACTERISTICS
Symbol
C1
Value
1 μF
Type
GRM188B31C105KA92
Maker
Murata
Murata
C10
22 pF
1.2 pF
GRM1882C1H220JA01
ATC100A1R2JW
C11
American Technical
Ceramics
C12
C13
C14
C20
C21
C22
R1
4.7 pF
15 pF
12 pF
10 pF
3.9 pF
100 pF
2 kΩ
ATC100A4R7BW
ATC100A150BW
ATC100A120BW
ATC100A100JW
ATC100A3R9BW
ATC100A101JW
American Technical
Ceramics
American Technical
Ceramics
American Technical
Ceramics
American Technical
Ceramics
American Technical
Ceramics
American Technical
Ceramics
1/10 W Chip Resistor
KOA
RK73B1JTTD202J
L1
123 nH
10 nH
9.8 nH
20 nH
−
φ 0.5 mm, φ D = 3 mm, 10 Turns
LQW18AN10NG00
Ohesangyou
Murata
L2
L3
L4
φ 0.4 mm, φ D = 1.6 mm, 3 Turns
φ 0.5 mm, φ D = 3 mm, 2 Turns
R4775, t = 0.4 mm, εr = 4.5, size = 30 × 48 mm
WAKA 01K0790-20
Ohesangyou
Ohesangyou
Panasonic
WAKA
PCB
SMA Connecter
−
COMPONENT LAYOUT OF TEST CIRCUIT FOR 460 MHz
C1
C1
L1
C12
L2
C13
C14
C21
C20
R1
C22
C10
C11
L4
L3
R09DS0033EJ0200 Rev.2.00
Jul 04, 2012
Page 3 of 7
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