L8583D Line Card Access Switch
Data Sheet
October 2002
Absolute Maximum Ratings
Stresses in excess of the absolute maximum ratings can cause permanent damage to the device. These are abso-
lute stress ratings only. Functional operation of the device is not implied at these or any other conditions in excess
of those given in the operational sections of the data sheet. Exposure to absolute maximum ratings for extended
periods can adversely affect device reliability.
Table 2. Absolute Maximum Ratings
Parameter
Operating Temperature Range
Storage Temperature Range
Relative Humidity Range
Pin Soldering Temperature (t = 10 s max)
5 V Power Supply
Battery Supply
Logic Input Voltage
Input-to-output Isolation
Pole-to-pole Isolation
Min
–40
–40
5
—
—
—
—
—
—
Max
110
150
95
260
7
–85
7
330
330
Unit
°C
°C
%
°C
V
V
V
V
V
Handling Precautions
Although electrostatic discharge (ESD) protection circuitry has been designed into this device, proper precautions
must be taken to avoid exposure to ESD and electrical overstress (EOS) during all handling, assembly, and test
operations. Legerity employs both a human-body model (HBM) and a charged-device model (CDM) qualification
requirement in order to determine ESD-susceptibility limits and protection design evaluation. ESD voltage thresh-
olds are dependent on the circuit parameters used in each of the models, as defined by JEDEC's JESD22-A114
(HBM) and JESD22-C101 (CDM) standards.
Table 3. HBM ESD Threshold Voltage
Device
L8583D
Rating
1000 V
4
ZARLINK [ ZARLINK SEMICONDUCTOR INC ]
