R
XC9572XL High Performance CPLD
Absolute Maximum Ratings
(2)
Symbol
V
CC
V
IN
V
TS
T
STG
T
J
Description
Supply voltage relative to GND
Input voltage relative to GND
(1)
Voltage applied to 3-state output
(1)
Storage temperature (ambient)
(3)
Junction temperature
Value
–0.5 to 4.0
–0.5 to 5.5
–0.5 to 5.5
–65 to +150
+150
Units
V
V
V
o
C
o
C
Notes:
1. Maximum DC undershoot below GND must be limited to either 0.5V or 10 mA, whichever is easier to achieve. During transitions, the
device pins may undershoot to –2.0 V or overshoot to +7.0V, provided this over- or undershoot lasts less than 10 ns and with the
forcing current being limited to 200 mA. External I/O voltage may not exceed V
CCINT
by 4.0V.
2. Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress
ratings only, and functional operation of the device at these or any other conditions beyond those listed under Operating Conditions
is not implied. Exposure to Absolute Maximum Ratings conditions for extended periods of time may affect device reliability.
3. For soldering guidelines and thermal considerations, see the
information on the Xilinx website. For Pb-free
packages, see
Recommended Operation Conditions
Symbol
V
CCINT
V
CCIO
V
IL
V
IH
V
O
Parameter
Supply voltage for internal logic
and input buffers
Commercial T
A
= 0
o
C to 70
o
C
Industrial T
A
= –40
o
C to +85
o
C
Min
3.0
3.0
3.0
2.3
0
2.0
0
Max
3.6
3.6
3.6
2.7
0.80
5.5
V
CCIO
Units
V
V
V
V
V
V
V
Supply voltage for output drivers for 3.3V operation
Supply voltage for output drivers for 2.5V operation
Low-level input voltage
High-level input voltage
Output voltage
Quality and Reliability Characteristics
Symbol
T
DR
N
PE
V
ESD
Data Retention
Program/Erase Cycles (Endurance)
Electrostatic Discharge (ESD)
Parameter
Min
20
10,000
2,000
Max
-
-
-
Units
Years
Cycles
Volts
DC Characteristic Over Recommended Operating Conditions
Symbol
V
OH
V
OL
I
IL
I
IH
I
IH
Parameter
Output high voltage for 3.3V outputs
Output high voltage for 2.5V outputs
Output low voltage for 3.3V outputs
Output low voltage for 2.5V outputs
Input leakage current
I/O high-Z leakage current
I/O high-Z leakage current
Test Conditions
I
OH
= –4.0 mA
I
OH
= –500
μA
I
OL
= 8.0 mA
I
OL
= 500
μA
V
CC
= Max; V
IN
= GND or V
CC
V
CC
= Max; V
IN
= GND or V
CC
V
CC
= Max; V
CCIO
= Max;
V
IN
= GND or 3.6V
V
CC
Min < V
IN
< 5.5V
C
IN
I
CC
I/O capacitance
Operating supply current
(low power mode, active)
V
IN
= GND; f = 1.0 MHz
V
IN
= GND, No load; f = 1.0 MHz
Min
2.4
90% V
CCIO
-
-
-
-
-
-
-
20 (Typical)
Max
-
-
0.4
0.4
±10
±10
±10
±50
10
Units
V
V
V
V
μA
μA
μA
μA
pF
mA
DS057 (v2.0) April 3, 2007
Product Specification
3