XC4000, XC4000A, XC4000H Logic Cell Array Families
user scan data to be shifted out on TDO. The data register
clock (BSCAN.DRCK) is available for control of test logic
which the user may wish to implement with CLBs. The
NAND of TCK and Run-test-idle is also provided
(BSCAN.IDLE).
Boundary Scan
Boundary Scan is becoming an attractive feature that
helps sophisticated systems manufacturers test their PC
boards more safely and more efficiently. The XC4000
family implements IEEE 1149.1-compatible BYPASS,
PRELOAD/SAMPLEandEXTESTBoundary-Scaninstruc-
tions. When the Boundary-Scan configuration option is
selected, three normal user I/O pins become dedicated
inputs for these functions.
The XC4000 Boundary Scan instruction set also includes
instructions to configure the device and read back the con-
figuration data.
Table 4. Boundary Scan Instruction
The “bed of nails” has been the traditional method of
testing electronic assemblies. This approach has become
less appropriate, due to closer pin spacing and more
sophisticated assembly methods like surface-mount tech-
nology and multi-layer boards. The IEEE Boundary Scan
standard 1149.1 was developed to facilitate board-level
testing of electronic assemblies. Design and test engi-
neers can imbed a standard test logic structure in their
electronic design. This structure is easily implemented
with the serial and/or parallel connections of a four-pin
interface on any Boundary-Scan-compatible IC. By exer-
cising these signals, the user can serially load commands
and data into these devices to control the driving of their
outputs and to examine their inputs. This is an improve-
ment over bed-of-nails testing. It avoids the need to over-
drive device outputs, and it reduces the user interface to
four pins. An optional fifth pin, a reset for the control logic,
is described in the standard but is not implemented in the
Xilinx part.
Instruction
Test
TDO
I/O Data
Source
I2
I1
0
0
1
1
0
0
1
1
I0
Selected
Source
0
0
0
0
1
1
1
1
0
1
0
1
0
1
0
1
Extest
Sample/Preload
User 1
DR
DR
DR
Pin/Logic
Pin/Logic
Pin/Logic
Pin/Logic
Disabled
—
TDO1
User 2
TDO2
Readback
Configure
Reserved
Bypass
Readback Data
DOUT
—
Bypass Reg
Pin/Logic
X2679
Bit Sequence
The bit sequence within each IOB is: in, out, 3-state.
From a cavity-up (XDE) view of the chip, starting in the
upper right chip corner, the Boundary-Scan data-register
bits have the following order.
Table 5. Boundary Scan Order
Thededicatedon-chiplogicimplementingtheIEEE1149.1
functions includes a 16-state machine, an instruction reg-
ister and a number of data registers. A register operation
begins with a capture where a set of data is parallel loaded
into the designated register for shifting out. The next state
is shift, where captured data are shifted out while the
desireddataareshiftedin.Anumberofstatesareprovided
for Wait operations. The last state of a register sequence
is the update where the shifted content of the register is
loaded into the appropriate instruction- or data-holding
register, either for instruction-register decode or for data-
register pin control.
TDO.T
TDO.O
Bit 0 ( TDO end)
Bit 1
Bit 2
Top-edge IOBs (Right to Left)
Left-edge IOBs (Top to Bottom)
MD1.T
MD1.O
MD1.I
MD0.I
MD2.I
Bottom-edge IOBs (Left to Right)
The primary data register is the Boundary-Scan register.
For each IOB pin in the LCA device, it includes three bits
of shift register and three update latches for: in, out and 3-
state control. Non-IOB pins have appropriate partial bit
population for in or out only. Each Extest Capture captures
all available input pins.
Right-edge IOBs (Bottom to Top)
B SCANT.UPD
(TDI end)
X6075
The data register also includes the following non-pin bits:
TDO.T, and TDO.I, which are always bits 0 and 1 of the
data register, respectively, and BSCANT.UPD which is
always the last bit of the data register. These three Bound-
ary-Scanbitsarespecial-purposeXilinxtestsignals.PRO-
GRAM, CCLK and DONE are not included in the Bound-
ary-Scan register. For more information regarding Bound-
ary Scan, refer to XAPP 017.001, Boundary Scan in
XC4000 Devices.
The other standard data register is the single flip-flop
bypass register. It resynchronizes data being passed
through a device that need not be involved in the current
scan operation. The LCA device provides two user nets
(BSCAN.SEL1 and BSCAN.SEL2) which are the decodes
of two user instructions. For these instructions, two corre-
sponding nets (BSCAN.TDO1 and BSCAN.TDO2) allow
2-22
XILINX [ XILINX, INC ]
