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5962-9473002MXC 参数 Datasheet PDF下载

5962-9473002MXC图片预览
型号: 5962-9473002MXC
PDF下载: 下载PDF文件 查看货源
内容描述: [Field Programmable Gate Array, 576 CLBs, 10000 Gates, 90.9MHz, 1368-Cell, CMOS, CPGA223, CERAMIC, PGA-223]
分类和应用: 时钟可编程逻辑
文件页数/大小: 68 页 / 685 K
品牌: XILINX [ XILINX, INC ]
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R
XC4000E and XC4000X Series Field Programmable Gate Arrays  
Figure 41 on page 44 is a diagram of the XC4000 Series  
boundary scan logic. It includes three bits of Data Register  
per IOB, the IEEE 1149.1 Test Access Port controller, and  
the Instruction Register with decodes.  
data register, respectively, and BSCANT.UPD, which is  
always the last bit of the data register. These three bound-  
ary scan bits are special-purpose Xilinx test signals.  
The other standard data register is the single flip-flop  
BYPASS register. It synchronizes data being passed  
through the FPGA to the next downstream boundary scan  
device.  
XC4000 Series devices can also be configured through the  
boundary scan logic. See “Readback” on page 55.  
Data Registers  
The FPGA provides two additional data registers that can  
be specified using the BSCAN macro. The FPGA provides  
two user pins (BSCAN.SEL1 and BSCAN.SEL2) which are  
the decodes of two user instructions. For these instructions,  
The primary data register is the boundary scan register. For  
each IOB pin in the FPGA, bonded or not, it includes three  
bits for In, Out and 3-State Control. Non-IOB pins have  
appropriate partial bit population for In or Out only. PRO-  
GRAM, CCLK and DONE are not included in the boundary  
scan register. Each EXTEST CAPTURE-DR state captures  
all In, Out, and 3-state pins.  
two  
corresponding  
pins  
(BSCAN.TDO1  
and  
BSCAN.TDO2) allow user scan data to be shifted out on  
TDO. The data register clock (BSCAN.DRCK) is available  
for control of test logic which the user may wish to imple-  
ment with CLBs. The NAND of TCK and RUN-TEST-IDLE  
is also provided (BSCAN.IDLE).  
The data register also includes the following non-pin bits:  
TDO.T, and TDO.O, which are always bits 0 and 1 of the  
EXTEST  
SLEW  
RATE  
PULL  
DOWN  
PULL  
UP  
M
TS INV  
TS/OE  
3-State TS  
V
CC  
6
TS - capture  
TS - update  
Boundary  
Scan  
OUTPUT  
INVERT  
OUTPUT  
M
sd  
D
Q
Ouput Data O  
EC  
M
M
INVERT  
PAD  
M
Ouput Clock OK  
rd  
OUT  
SEL  
S/R  
M
O - capture  
Q - capture  
Clock Enable  
Boundary  
Scan  
O - update  
M
I - capture  
Boundary  
Scan  
Input Data 1 I1  
Input Data 2 I2  
I - update  
M
M
M
M
sd  
Q
D
EC  
DELAY  
Q
L
M
M
INVERT  
M
FLIP-FLOP/LATCH  
Input Clock IK  
rd  
S/R  
INPUT  
GLOBAL  
S/R  
X5792  
Figure 40: Block Diagram of XC4000E IOB with Boundary Scan (some details not shown).  
XC4000X Boundary Scan Logic is Identical.  
May 14, 1999 (Version 1.6)  
6-43  
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