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5962-9473002MXC 参数 Datasheet PDF下载

5962-9473002MXC图片预览
型号: 5962-9473002MXC
PDF下载: 下载PDF文件 查看货源
内容描述: [Field Programmable Gate Array, 576 CLBs, 10000 Gates, 90.9MHz, 1368-Cell, CMOS, CPGA223, CERAMIC, PGA-223]
分类和应用: 时钟可编程逻辑
文件页数/大小: 68 页 / 685 K
品牌: XILINX [ XILINX, INC ]
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R
XC4000E and XC4000X Series Field Programmable Gate Arrays  
Table 16: Pin Descriptions (Continued)  
I/O  
I/O  
During  
After  
Pin Name  
Config. Config.  
Pin Description  
These four inputs are used in Asynchronous Peripheral mode. The chip is selected  
when CS0 is Low and CS1 is High. While the chip is selected, a Low on Write Strobe  
(WS) loads the data present on the D0 - D7 inputs into the internal data buffer. A Low  
on Read Strobe (RS) changes D7 into a status output — High if Ready, Low if Busy —  
and drives D0 - D6 High.  
CS0, CS1,  
WS, RS  
I
I/O  
In Express mode, CS1 is used as a serial-enable signal for daisy-chaining.  
WS and RS should be mutually exclusive, but if both are Low simultaneously, the Write  
Strobe overrides. After configuration, these are user-programmable I/O pins.  
During Master Parallel configuration, these 18 output pins address the configuration  
EPROM. After configuration, they are user-programmable I/O pins.  
A0 - A17  
O
O
I
I/O  
I/O  
I/O  
I/O  
A18 - A21  
(XC4003XL to  
XC4085XL)  
During Master Parallel configuration with an XC4000X master, these 4 output pins add  
4 more bits to address the configuration EPROM. After configuration, they are user-pro-  
grammable I/O pins. (See Master Parallel Configuration section for additional details.)  
During Master Parallel and Peripheral configuration, these eight input pins receive con-  
figuration data. After configuration, they are user-programmable I/O pins.  
D0 - D7  
During Slave Serial or Master Serial configuration, DIN is the serial configuration data  
input receiving data on the rising edge of CCLK. During Parallel configuration, DIN is  
the D0 input. After configuration, DIN is a user-programmable I/O pin.  
DIN  
I
During configuration in any mode but Express mode, DOUT is the serial configuration  
data output that can drive the DIN of daisy-chained slave FPGAs. DOUT data changes  
on the falling edge of CCLK, one-and-a-half CCLK periods after it was received at the  
DIN input.  
DOUT  
O
I/O  
In Express modefor XC4000E and XC4000X only, DOUT is the status output that can  
drive the CS1 of daisy-chained FPGAs, to enable and disable downstream devices.  
After configuration, DOUT is a user-programmable I/O pin.  
Unrestricted User-Programmable I/O Pins  
These pins can be configured to be input and/or output after configuration is completed.  
Before configuration is completed, these pins have an internal high-value pull-up resis-  
tor (25 k- 100 k) that defines the logic level as High.  
Weak  
Pull-up  
I/O  
I/O  
of how to enable this circuitry are covered later in this sec-  
tion.  
Boundary Scan  
The ‘bed of nails’ has been the traditional method of testing  
electronic assemblies. This approach has become less  
appropriate, due to closer pin spacing and more sophisti-  
cated assembly methods like surface-mount technology  
and multi-layer boards. The IEEE Boundary Scan Standard  
1149.1 was developed to facilitate board-level testing of  
electronic assemblies. Design and test engineers can  
imbed a standard test logic structure in their device to  
achieve high fault coverage for I/O and internal logic. This  
structure is easily implemented with a four-pin interface on  
any boundary scan-compatible IC. IEEE 1149.1-compati-  
ble devices may be serial daisy-chained together, con-  
nected in parallel, or a combination of the two.  
By exercising these input signals, the user can serially load  
commands and data into these devices to control the driv-  
ing of their outputs and to examine their inputs. This  
method is an improvement over bed-of-nails testing. It  
avoids the need to over-drive device outputs, and it reduces  
the user interface to four pins. An optional fifth pin, a reset  
for the control logic, is described in the standard but is not  
implemented in Xilinx devices.  
The dedicated on-chip logic implementing the IEEE 1149.1  
functions includes a 16-state machine, an instruction regis-  
ter and a number of data registers. The functional details  
can be found in the IEEE 1149.1 specification and are also  
discussed in the Xilinx application note XAPP 017: “Bound-  
ary Scan in XC4000 Devices.”  
The XC4000 Series implements IEEE 1149.1-compatible  
BYPASS, PRELOAD/SAMPLE and EXTEST boundary  
scan instructions. When the boundary scan configuration  
option is selected, three normal user I/O pins become ded-  
icated inputs for these functions. Another user output pin  
becomes the dedicated boundary scan output. The details  
Figure 40 on page 43 shows a simplified block diagram of  
the XC4000E Input/Output Block with boundary scan  
implemented. XC4000X boundary scan logic is identical.  
6-42  
May 14, 1999 (Version 1.6)  
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