4.3.2 Groups C and D inspections. Groups C and D inspections shall be in accordance with method 5005 of MIL-STD-883
and as follows:
a. End-point electrical parameters shall be as specified in table II herein.
b. All devices requiring end-point electrical testing shall be programmed with a checkerboard or equivalent alternating bit
pattern.
c. Steady-state life test conditions, method 1005 of MIL-STD-883.
(1) Test condition D or F. The test circuit shall be maintained by the manufacturer under document revision level control
and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the
inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005
of MIL-STD-883.
(2) TA = +125°C, minimum.
(3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.
4.4 Methods of inspection. Methods of inspection shall be as specified in the appropriate tables of method 5005 of MIL-STD-
883 and as follows.
4.4.1 Voltage and current. All voltages given are referenced to the microcircuit VSS terminal. Currents given are conventional
current and positive when flowing into the referenced terminal.
4.4.2 Programming procedure. The programming procedures shall be as specified by the device manufacturer and shall be
made available on request.
4.4.3 Erasing procedure. The erasing procedures shall be as specified by the device manufacturer and shall be made
available on request.
4.4.4 Software data protection. The software data protect procedures shall be as specified by the device manufacturer and
shall be made available on request.
5. PACKAGING
5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535, appendix A.
SIZE
STANDARD
5962-88634
MICROCIRCUIT DRAWING
A
REVISION LEVEL
F
SHEET
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
18
DSCC FORM 2234
APR 97
XICOR [ XICOR INC. ]
