WM8786
Production Data
ELECTRICAL CHARACTERISTICS
Test Conditions
DVDD = 3.3V, AVDD = 5.0V, TA = +25oC, 1kHz signal, A-weighted, fs = 48kHz, MCLK = 256fs, 24-bit audio data, Slave Mode
unless otherwise stated.
PARAMETER
SYMBOL
TEST CONDITIONS
MIN
TYP
MAX
UNIT
ADC Performance
Full Scale Input Signal Level
(for ADC 0dB Input)
Input resistance
2.0
Vrms
10
k
Ω
pF
dB
Input capacitance
10
Signal to Noise Ratio (Note
1,2,4)
SNR
SNR
SNR
THD
A-weighted,
@ fs = 48kHz
Unweighted,
@ fs = 48kHz
A-weighted,
102
111
108
111
108
111
108
dB
dB
dB
dB
dB
Signal to Noise Ratio (Note
1,2,4)
@ fs = 96kHz
Unweighted,
@ fs = 96kHz
A-weighted,
Signal to Noise Ratio (Note
1,2,4)
@ fs = 192kHz
Unweighted,
@ fs = 192kHz
Total Harmonic Distortion
Total Harmonic Distortion
1kHz, -0.1dB Full Scale
@ fs = 48kHz
-102
-102
-92
dB
dB
dB
%
1kHz, -0.1dB Full Scale
@ fs = 96kHz
1kHz, -0.1dB Full Scale
@ fs = 192kHz
-102
THD
1kHz, -0.1dB Full Scale
@ fs = 48kHz
0.0008
0.0008
0.0008
0.0025
1kHz, -0.1dB Full Scale
@ fs = 96kHz
%
1kHz, -0.1dB Full Scale
@ fs = 192kHz
%
Dynamic Range
DNR
-60dBFS
102
111
0.1
50
dB
dB
dB
Channel Level Matching
Power Supply Rejection Ratio
20kHz signal
PSRR
1kHz 100mVpp, applied
to AVDD, DVDD
20Hz to 20kHz
100mVpp
45
dB
Digital Logic Levels (CMOS Levels)
Input LOW level
VIL
VIH
0.3 x DVDD
+1
V
V
Input HIGH level
0.7 x DVDD
-1
Input leakage current
Input capacitance
0.2
5
µA
pF
V
Output LOW
VOL
VOH
I
OL=1mA
0.1 x DVDD
Output HIGH
I
OH= -1mA
0.9 x DVDD
V
Analogue Reference Levels
Midrail Reference Voltage
VMID
RVMID
VREF
AVDD to VMID and
VMID to VREFGND
–3%
50
AVDD/2
k
+3%
+3%
V
Ω
V
Potential Divider Resistance
Buffered Reference Voltage
AVDD to VMID and
VMID to GND
–3%
0.8 x AVDD
PD Rev 4.2 February 2007
6
w
WOLFSON [ WOLFSON MICROELECTRONICS PLC ]
