Product Preview
WM8777
Test Conditions
AVDDDAC = 5V, AVDDADC=5V, DVDD = 3.3V, AGNDDAC = 0V, AGNDADC = 0, DGND = 0V, TA = +25oC, fs = 48kHz, MCLK
= 256fs, ADC/DAC in Slave Mode unless otherwise stated.
PARAMETER
SYMBOL
TEST CONDITIONS
MIN
TYP
MAX
UNIT
Analogue Bass Management and Tone Controls
Treble range adjustment
Treble step size
-10
+10
dB
dB
dB
dB
1
1
Bass range adjustment
-10
+10
Bass step size
Headphone Amplifier at 0dB Volume (Load=16 Ω, at 1Vrms)
Headphone output level
1.5
-74
-96
Vrms
dB
THD
SNR
dB
Headphone Amplifier at 0dB Volume (Load=32 Ω, at 1Vrms)
Headphone output level
0.95
-68
Vrms
dB
THD
SNR
-100
dB
S/PDIF Transceiver
Jitter on recovered clock (Rms
period jitter)
50
Ps
S/PDIF Input Levels CMOS MODE
Input LOW level
Input HIGH level
Input capacitance
Input Frequency
VIL
VIH
0.3 X DVDD
36
V
V
0.7 X DVDD
1.25
pF
MHz
S/PDIF Input Levels Comparator MODE
Input capacitance
Input resistance
Input frequency
Input Amplitude
PLL
1.31
18
pF
Ω
25
MHz
mV
200
0.5 X DVDD
Period Jiffer
XTAL
80
ps(rms)
Input XTI LOW level
Input XTI HIGH level
Input XTI capacitance
Input XTI leakage
Output XTO LOW
Output XTO HIGH
Notes:
VXIL
0
557
mV
mV
pF
VXIH
CXJ
853
3.32
28.92
86
4.491
38.96
278
IXleak
VXOL
VXOH
mA
mV
V
15pF load capacitors
15pF load capacitors
1.458
1.942
1. Ratio of output level with 1kHz full scale input, to the output level with all zeros into the digital input, measured ‘A’
weighted.
2. All performance measurements done with 20kHz low pass filter, and where noted an A-weight filter. Failure to use
such a filter will result in higher THD+N and lower SNR and Dynamic Range readings than are found in the Electrical
Characteristics. The low pass filter removes out of band noise; although it is not audible it may affect dynamic
specification values.
3. VMID decoupled with 10uF and 0.1uF capacitors (smaller values may result in reduced performance).
PP Rev 1.94 November 2004
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9
WOLFSON [ WOLFSON MICROELECTRONICS PLC ]
