WM8740
Production Data
Test Conditions
AVDD, DVDD = 5V, AGND, DGND = 0V, TA = +25oC, fs = 48kHz, SCKI = 256fs unless otherwise stated.
PARAMETER
SYMBOL
TEST CONDITIONS
MIN
TYP
MAX
UNIT
Analogue Output Levels
Output level differential
Into 10kΩ, full scale 0dB,
2
1.32
1
VRMS
VRMS
kΩ
(5V supply)
Into 10kΩ, full scale 0dB,
(3.3V supply)
Minimum resistance load
To midrail or AC coupled
(5V supply)
To midrail or AC coupled
(3.3V supply)
600
Ω
Maximum capacitance load
Output DC level
5V or 3.3V
100
pF
V
AVDD/2
Reference Levels
Potential divider resistance
10
AVDD/2
2.2
kΩ
AVDD to VMIDL/VMIDR and
VMIDL/VMIDR to AGND
Voltage at VMIDL/VMIDR
POR (Power-On Reset)
POR threshold
V
Notes: 1.
Ratio of output level with 1kHz full scale input, to the output level with all zeros into the digital input, measured ‘A’
weighted over a 20Hz to 20kHz bandwidth.
2.
All performance measurements done with 20kHz low pass filter. Failure to use such a filter will result in higher
THD+N and lower SNR and Dynamic Range readings than are found in the Electrical Characteristics. The low
pass filter removes out of band noise; although it is not audible it may affect dynamic specification values.
LRCIN
tBCH
tBCL
tLB
BCKIN
DIN
tBCY
tBL
tDS
tDH
Figure 1 Audio Data Input Timing
Test Conditions
AVDD, DVDD = 5V, AGND, DGND = 0V, TA = +25oC, fs = 48kHz, SCKI = 256fs unless otherwise stated.
PARAMETER
SYMBOL
TEST CONDITIONS
MIN
TYP
MAX
UNIT
Audio Data Input Timing Information
BCKIN pulse cycle time
BCKIN pulse width high
BCKIN pulse width low
tBCY
tBCH
tBCL
tBL
100
40
ns
ns
ns
ns
40
BCKIN rising edge to
LRCIN edge
20
LRCIN rising edge to
BCKIN rising edge
tLB
20
ns
DIN setup time
DIN hold time
tDS
tDH
20
20
ns
ns
PD Rev 4.0 April 2004
7
w
WOLFSON [ WOLFSON MICROELECTRONICS PLC ]
