WM8711L
Production Data
ELECTRICAL CHARACTERISTICS
Test Conditions
AVDD, HPVDD, DBVDD = 1.8V, AGND = 0V, DCVDD = 1.5V, DGND = 0V, TA = +25oC, Slave Mode, fs = 48kHz, MCLK = 256fs
unless otherwise stated.
PARAMETER
SYMBOL
TEST CONDITIONS
MIN
TYP
MAX
UNIT
Digital Logic Levels (CMOS Levels)
Input LOW level
VIL
VIH
VOL
0.3 x DBVDD
V
V
V
Input HIGH level
0.7 x DBVDD
0.9 x DBVDD
Output LOW
IOL = 1mA
0.10 x
DBVDD
Output HIGH
VOH
IOH = -1mA
V
Power On Reset Threshold (DCVDD)
DCVDD Threshold On -> Off
Hysteresis
0.9
0.3
0.6
V
V
V
DCVDD Threshold Off -> On
Analogue Reference Levels
Reference voltage (VMID)
Potential divider resistance
VVMID
RVMID
AVDD/2
50k
V
Line Output for DAC Playback Only (Load = 10K. 50pF)
0dBFs Full scale output voltage
At LINE outputs
1.0 x
AVDD/3.3
90
Vrms
dB
Signal to Noise Ratio
(Note 1,2)
SNR
A-weighted,
@ fs = 48kHz
A-weighted
85
85
90
90
@ fs = 96kHz
Dynamic Range (Note 2)
Total Harmonic Distortion
DR
A-weighted, -60dB
full scale input
dB
dB
THD
1kHz, 0dBFs
1kHz, -3dBFs
1kHz 100mVpp
-81
-88
50
-75
Power Supply Rejection Ratio
PSRR
dB
20Hz to 20kHz
100mVpp
45
DAC channel separation
1kHz, 0dB signal
100
dB
Analogue Line Input to Line Output (Load = 10k. 50pF, No Gain on Input ) Bypass Mode
0dB Full scale output voltage
1.0 x
AVDD/3.3
101
Vrms
dB
Signal to Noise Ratio
(Note 1,2)
SNR
THD
90
Total Harmonic Distortion
Stereo Headphone Output
0dB Full scale output voltage
1kHz, 0dB
-93
-85
dB
1.0 x
Vrms
mW
dB
AVDD/3.3
Max Output Power
PO
RL = 32
RL = 16
A-weighted
9
18
86
Signal to Noise Ratio
(Note 1,2)
SNR
80
PD, Rev 4.5, August 2011
6
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