Production Data
WM2631
ABSOLUTE MAXIMUM RATINGS
Absolute Maximum Ratings are stress ratings only. Permanent damage to the device may be caused by continuously operating at
or beyond these limits. Device functional operating limits and guaranteed performance specifications are given under Electrical
Characteristics at the test conditions specified.
ESD Sensitive Device. This device is manufactured on a CMOS process. It is therefore generically susceptible
to damage from excessive static voltages. Proper ESD precautions must be taken during handling and storage
of this device.
CONDITION
MIN
MAX
7V
Digital supply voltages, AVDD or DVDD to GND
Reference input voltage
-0.3V
-0.3V
AVDD + 0.3V
DVDD + 0.3V
Digital input voltage range to GND
Operating temperature range, TA
WM2631CDT
WM2631IDT
0°C
70°C
85°C
-40°C
-65°C
Storage temperature
150°C
Soldering lead temperature, 1.6mm (1/16 inch) from package body for
10 seconds
260°C
RECOMMENDED OPERATING CONDITIONS
PARAMETER
SYMBOL
TEST CONDITIONS
MIN
TYP
MAX
UNIT
Supply voltage
AVDD,
DVDD
VIH
2.7
2
5.5
V
High-level digital input voltage
Low-level digital input voltage
Reference voltage to REF
V
V
VIL
0.8
VREF
AVDD = 5V
AVDD = 3V
GND
GND
2
2.048
1.024
AVDD
AVDD
V
Output Load Resistance
Load capacitance
RL
CL
TA
kΩ
pF
°C
°C
100
70
Operating free-air temperature
WM2631CDT
0
WM2631IDT
-40
85
Note: Reference input voltages greater than AVDD/2 will cause saturation for large DAC codes.
WOLFSON MICROELECTRONICS LTD
PD Rev 1.1 April 2001
3
WOLFSON [ WOLFSON MICROELECTRONICS PLC ]
