Production Data
WM2629
Test Characteristics:
Over recommended operating conditions (unless noted otherwise).
TEST
PARAMETER
SYMBOL
MIN
TYP
MAX
UNIT
CONDITIONS
Digital Inputs
High level input current
Low level input current
Input capacitance
IIH
IIL
CI
Input voltage = DVDD
Input voltage = 0V
1
µA
µA
pF
-1
8
7
Digital Output
High level digital output voltage
Low level digital output voltage
Output voltage rise time
VOH
VOL
Load = 10kΩ
Load = 10kΩ
2.6
V
V
0.4
20
Load = 10kΩ, 20pF, includes
ns
propagation delay
Notes:
1. Integral non-linearity (INL) is the maximum deviation of the output from the line between zero and full scale excluding
the effects of zero code and full scale errors).
2. Differential non-linearity (DNL) is the difference between the measured and ideal 1LSB amplitude change
of any adjacent two codes. A guarantee of monotonicity means the output voltage changes in the same
direction (or remains constant) as a change in digital input code.
3. Zero code error is the voltage output when the DAC input code is zero.
4. Gain error is the deviation from the ideal full-scale output excluding the effects of zero code error.
5. Power supply rejection ratio is measured by varying AVDD from 4.5V to 5.5V and measuring the
proportion of this signal imposed on the zero code error and the gain error.
6. Zero code error and Gain error temperature coefficients are normalised to full-scale voltage.
7. Output load regulation is the difference between the output voltage at full scale with a 10kΩ load and 2kΩ
load. It is expressed as a percentage of the full scale output voltage with a 10kΩ load.
8.
I
DD is measured while continuously writing code 128 to the DAC. For VIH < DVDD - 0.7V and VIL > 0.7V
supply current will increase.
9. Slew rate results are for the lower value of the rising and falling edge slew rates.
10. Settling time is the time taken for the signal to settle to within 0.5LSB of the final measured value for both rising and
falling edges. Limits are ensured by design and characterisation, but are not production tested.
WOLFSON MICROELECTRONICS LTD
PD Rev 1.0 April 2001
5
WOLFSON [ WOLFSON MICROELECTRONICS PLC ]
