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29F400B-12TI 参数 Datasheet PDF下载

29F400B-12TI图片预览
型号: 29F400B-12TI
PDF下载: 下载PDF文件 查看货源
内容描述: [Flash, 512KX8, 120ns, PDSO48, TSOP-48]
分类和应用: 光电二极管内存集成电路
文件页数/大小: 38 页 / 227 K
品牌: WINBOND [ WINBOND ]
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BRIGHT  
Microelectronics  
Inc.  
Preliminary BM29F400T/BM29F400B  
4MEGABIT (512K x 8/ 256K x 16)  
5VOLT SECTOR ERASE CMOS FLASH MEMORY  
GENERAL DESCRIPTION  
The BM29F400 is an 4 Megabit, 5.0 volt-only CMOS Flash memory device organized as a 512  
Kbytes of 8-bits each, or 256 Kbytes of 16 bits each. The device is offered in standard 44-pin SOP  
and 48-pin TSOP packages. It is designed to be programmed and erased in-system with a 5.0 volt  
power-supply and can also be reprogrammed in standard EPROM programmers.  
With access times of 90 nS, 120 nS, and 150 nS, the BM29F400 has separate chip enable CE, write  
enable WE , and output enable OE controls. BMI's memory devices reliably store memory data even  
after 100,000 program and erase cycles.  
The BM29F400 is entirely pin and command set compatible with the JEDEC standard for 4 Megabit  
Flash memory devices. Commands are written to the command register using standard  
microprocessor write timings. Register contents serve as input to an internal state-machine which  
controls the erase and programming circuitry. Write cycles also internally latch addresses and data  
needed for the programming and erase operations.  
The BM29F400 is programmed by executing the program command sequence. This will start the  
internal byte/word programming algorithm that automatically times the program pulse width and also  
verifies the proper cell margin. Erase is accomplished by executing either the sector erase or chip  
erase command sequence. This will start the internal erasing algorithm that automatically times the  
erase pulse width and also verifies the proper cell margin. No preprogramming is required prior to  
execution of the internal erase algorithm. Sectors of the BM29F400 Flash memory array are  
electrically erased via Fowler-Nordheim tunneling. Bytes/words are programmed one byte/word at a  
time using a hot electron injection mechanism.  
The BM29F400 features a sector erase architecture. The device memory array is divided into one 16  
Kbytes, two 8 Kbytes, one 32 Kbytes, and seven 64 Kbytes. Sectors can be erased individually or in  
groups without affecting the data in other sectors. Multiple sector erase and full chip erase capabilities  
add flexibility to altering the data in the device. To protect this data from accidental program and  
erase, the device also has a sector protect function. This function hardware write protects the  
selected sector(s). The sector protect and sector unprotect features can be enabled in a PROM  
programmer.  
For read, program and erase operation, the BM29F400 needs a single 5.0 volt power-supply.  
Internally generated and well regulated voltages are provided for the program and erase operation. A  
low Vcc detector inhibits write operations on loss of power. End of program or erase is detected by the  
Ready/Busy status pin, Data Polling of DQ7, or by the Toggle Bit I feature on DQ6. Once the program  
or erase cycle has been successfully completed, the device internally resets to the Read mode.  
The BM29F400 also has a hardware RESET pin. Driving the RESET pin low during execution of an  
Internal Programming or Erase command will terminate the operation and reset the device to the  
Read mode. The RESET pin may be tied to the system reset circuitry, so that the system will have  
access to boot code upon completion of system reset, even if the Flash device is in the process of an  
Internal Programming or Erase operation. If the device is reset using the RESET pin during an  
Internal Programming or Erase operation, data in the address locations on which the internal state  
A Winbond Company  
Publication Release Date: May 1999  
Revision A1  
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