TABLE I. Electrical performance characteristics - Continued.
Test
Symbol
Conditions 1/ 2/
-55°C ≤ TC ≤ +125°C
4.5 V dc ≤ VCC ≤ 5.5 V dc,
Group A
subgroups
Device
types
Limits
Unit
Min
Max
VSS = 0 V
Unless otherwise specified
Functional testing
Functional tests
See 4.3.1c
7, 8A, 8B
9, 10, 11
All
Read cycle AC timing characteristics
Read cycle time
tRC
See figure 4
01
02
03
04
35
25
20
17
ns
Address access time
tAA
See figure 4
9, 10, 11
01
02
03
04
35
25
20
17
ns
Output hold from
address change
tOH
See figure 4
See figure 4
9, 10, 11
9, 10, 11
All
0
ns
ns
Chip select access
time
tACS
01
02
03
04
35
25
20
17
Output enable to
output valid
tOE
See figure 4
9, 10, 11
01
02
03
04
20
15
12
10
ns
Chip select to output
enable in low Z
tCLZ
See figure 4
See figure 4
9, 10, 11
9, 10 ,11
01,02,03
5
ns
ns
3/
3/
04
All
2
0
Output enable to
output in low Z
tOLZ
See footnotes at end of table.
SIZE
STANDARD
MICROCIRCUIT DRAWING
5962-96902
A
REVISION LEVEL
SHEET
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
F
6
DSCC FORM 2234
APR 97
WEDC [ WHITE ELECTRONIC DESIGNS CORPORATION ]
