TABLE I. Electrical performance characteristics.
Test
Symbol
Conditions
Group A
Subgroups
Device
type
Limits
Units
-55C TC +125C
4.5 V VCC 5.5 V
unless otherwise specified
Min
Max
300
95
Operating supply
current 1/
ICC1
1, 2, 3
1, 2, 3
01-06
07
mA
mA
all I/O's = 0 mA, WE , CE = VIL
VCC standby
current (TTL)
ICC2
01-06
07
60
25
CE = VIH, VIN < VIL
VIN > VIH
VCC standby
current (CMOS)
ICC3
1, 2, 3
1, 2, 3
01-03
25
mA
CE > VCC-0.2 V
IN > VCC-0.2 V or VIN < 0.2 V
V
04-06
07
10
15
Data retention
voltage
VDR
2.0
V
CE > VCC-0.2 V,
VIN > VCC-0.2 V or VIN < 0.2 V
04-07
04 - 06
07
Data retention
current
ICCDR
VCC = 2.0 V
2.0
12
mA
Input leakage
current (low)
IILK
VIN = 0.0 V to VCC
VI/O = 0.0 V to VCC
IOH = -4.0 mA
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
All
-10
-10
+10
+10
μA
μA
V
Output leakage
current (high)
IOLK
VOH
VOL
All
All
High level output
voltage
2.4
Low level output
voltage
IOL = 6.0 mA
01-06
07
V
0.4
0.4
I
OL = 8.0 mA
Input capacitance
CIN
4
All
12
14
pF
pF
V
IN = 0 V, TA = 25C,
f = 1.0 MHz, see 4.4.1e
Input/output
capacitance
CI/O
4
All
All
V
OUT = 0 V, TA = 25C,
f = 1.0 MHz, see 4.4.1e
Functional tests
See 4.4.1c
7, 8A, 8B
See footnotes at end of table.
SIZE
STANDARD
5962-96795
A
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
REVISION LEVEL
D
SHEET
6
DSCC FORM 2234
APR 97
WEDC [ WHITE ELECTRONIC DESIGNS CORPORATION ]
