TABLE I. Electrical performance characteristics - Continued.
Test
Symbol
Conditions
Group A
Subgroups
Device
type
Limits
Units
-55C TC +125C
4.5 V VCC 5.5 V
unless otherwise specified
Min
20
Max
Write pulse width
See figures 4 and 5 as
applicable 2/
01,04
02,05
03,06
07
tWLWH
tWLEH
9, 10, 11
ns
17
15
10
0
Write recovery time
9, 10, 11
9, 10, 11
All
ns
ns
tWHAX
tEHAX
Data hold time in high
Z
tWHDX
tEHDX
All
0
Write to output in high
Z
tWLQZ
01-07
0
8
ns
ns
9, 10, 11
9, 10, 11
Data to write time
01,04
02,05
03,06
07
15
12
10
7
tDVWH
tDVEH
Output active from end
of write
01,04
02,05
03,06
07
15
12
10
3
tWHQX
9, 10, 11
9, 10, 11
ns
ns
LB, UB valid to end of
write
01,04
02,05
03,06
07
20
18
16
10
tAVAV
tLBLLBH
tUBLUBH
Operation recovery
time
9, 10, 11
9, 10, 11
04-07
ns
ns
tR
Chip disable to data
retention time
See figures 4 and 5 as
applicable 2/
tCDR
All
0
CE > VCC-0.2 V,
VIN > VCC-0.2 v or VIN < 0.2 V
1/ ICC is dependent on output loading and cycle rate. The specified values apply with output(s) unloaded.
2/ AC measurements assume signal transition times of 5 ns or less, timing reference levels of 1.5 V, input pulse levels of
0 V to 3.0 V and output loading of 30 pF load capacitance, unless otherwise specified. Output timing reference is 1.5
V. See figure 4.
3/ For read cycles, WE is high for the entire cycle.
4/ Parameter, if not tested, shall be guaranteed to the limits specified in table I.
5/ Measured +500 mV from steady-state output voltage. Load capacitance is 5.0 pF.
SIZE
STANDARD
5962-96795
A
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
REVISION LEVEL
D
SHEET
9
DSCC FORM 2234
APR 97
WEDC [ WHITE ELECTRONIC DESIGNS CORPORATION ]
