TABLE I. Electrical performance characteristics - Continued.
Test
Symbol
Conditions
Group A
Subgroups
Device
type
Limits
Units
ns
-55C TC +125C
4.5 V VCC 5.5 V
unless otherwise specified
Min
35
Max
Read cycle time
tAVAV
See figures 4 and 5 as applicable 9, 10, 11
2/ 3/
01,04
02,05
25
03,06
07
20
12
Address access time tAVQV
9, 10, 11
01,04
35
ns
02,05
25
03,06
07
20
12
Chip enable access
time
tELQV
9, 10, 11
01,04
35
ns
02,05
25
03,06
07
20
12
Chip enable to
output in low Z
tELQX
9, 10, 11
9, 10, 11
01-06
5
3
ns
ns
07
Chip disable to
output in high Z
tEHQZ
01,04,
07
10
02,05
0
8
7
03,06
Output hold from
address change
tAVQX
9, 10, 11
01,02,
5
ns
04,05
03,06
4
3
07
See footnotes at end of table.
SIZE
STANDARD
5962-96795
A
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
REVISION LEVEL
D
SHEET
7
DSCC FORM 2234
APR 97
WEDC [ WHITE ELECTRONIC DESIGNS CORPORATION ]
