VSC7959
Data Sheet
Table 3. Loss of Signal Specifications
Symbol
Parameter
Min
Typ
Max
Unit Condition
H
LOS Hystersis
2.2
4.0
5.5
dB
H
= 20 log (V
/V
)
LOS
LOS
THD THA
K28.5 pattern
t
LOS Assert/Deassert Time
LOS Assert Threshold
1.0
µs
Response time for a 10dB
change in input power
LOS
V
15
mV
mV
R
= 5.6kΩ, f = 2.5Gb/s,
THA
THD
TH
K28.5 pattern
V
LOS Deassert Threshold
35
R
TH
= 5.6kΩ, f = 2.5Gb/s,
K28.5 pattern
V
V
LOS Output HIGH Voltage
LOS Output LOW Voltage
2.4
3.5
V
V
I
I
= –30µA
= 1.2mA
LOSH
LOS
LOS
0.3
LOSL
Table 4. Loss of Signal Truth Table
SQUELCH
HIGH
LOS
LOW
HIGH
HIGH
LOW
Output
On
LOW
On
HIGH
Off
LOW
On
Table 5. Recommended Operating Conditions
Symbol
Parameter
Min
Typ
Max
Unit
V
Condition
V
Power Supply Voltage for 3.3V Operation
Power Supply Voltage for 5V Operation
Junction Temperature Range
+3.135
+3.135
–40
+3.3
+5.0
+5.5
+5.5
+100
+85
CC_3.3
CC_5
J
V
V
T
T
°C
°C
(1)
OperatingTemperature Range
–40
1. Lower limit of specification is ambient temperature and upper limit is case temperature
Table 6. Absolute Maximum Ratings
Symbol Parameter
Min
Max
+6
Unit
V
Condition
V
Power Supply Voltage
–0.5
CC
Voltage at IN+, IN–
V
– 3
V
V
+ 0.5
V
CC
CC
CC
Voltage at SQUELCH, LOS, LOS, TH, LEVEL
Differential Input Voltage (IN+, IN–)
Continuous Current at CML Outputs (OUT+, OUT–)
Current into LOS, LOS
–0.5
+ 0.5
V
2.5
V
25
mA
mA
°C
°C
V
–2
+3
T
T
Junction Temperature
–55
–55
+125
+150
2500
J
Storage Temperature
S
V
ESD Voltage (Human Body Model)
ESD
Stresses listed under Absolute Maximum Ratings may be applied to devices one at a time without causing permanent damage. Functionality at or above the values
listed is not implied. Exposure to these values for extended periods may affect device reliability.
ELECTROSTATIC DISCHARGE
This device can be damaged by ESD. Vitesse recommends that all integrated circuits
be handled with appropriate precautions. Failure to observe proper handling and
installation procedures may adversely affect reliability of the device.
3 of 14
G52358, Rev 4.0
2/10/03