TPS3103xxx
TPS3106xxx
TPS3110xxx
SLVS363E – AUGUST 2001 – REVISED SEPTEMBER 2007
www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
ORDERING INFORMATION
(1)
PRODUCT
TPS3103E12DBVR
TPS3103E15DBVR
TPS3103H20DBVR
TPS3103K33DBVR
TPS3106E09DBVR
TPS3106E16DBVR
TPS3106K33DBVR
TPS3110E09DBVR
TPS3110E12DBVR
TPS3110E15DBVR
TPS3110K33DBVR
(1)
(2)
NOMINAL SUPPLY VOLTAGE
1.2 V
1.5 V
2.0 V
3.3 V
0.9 V
1.6 V
3.3 V
0.9 V
1.2 V
1.5 V
3.3 V
THRESHOLD VOLTAGE, V
IT (2)
1.142 V
1.434 V
1.84 V
2.941 V
0.86 V
1.521 V
2.941 V
0.86 V
1.142 V
1.434 V
2.941 V
For the most current package and ordering information see the Package Option Addendum at the end of this document, or see the TI
web site at
Custom threshold voltages are available. Minimum order quantities apply. Contact factory for details and availability.
AVAILABLE OPTIONS
DEVICE
TPS3103
TPS3106
TPS3110
Push-pull
RESET OUTPUT
Open-drain
Open-drain
ü
ü
ü
RSTSENSE, RSTVDD OUTPUT
SENSE INPUT
WDI INPUT
PFO OUTPUT
Open-drain
ABSOLUTE MAXIMUM RATINGS
(1)
Over operating free-air temperature range, unless otherwise noted.
VALUE
Supply voltage, V
DD (2)
MR Pin, V
MR
All other pins
(2)
Maximum low output current, I
OL
Maximum high output current, I
OH
Input clamp current, I
IK
(V
I
< 0 or V
I
> V
DD
)
Output clamp current, I
OK
(V
O
< 0 or V
O
> V
DD
)
Continuous total power dissipation
Operating temperature range, T
A
Storage temperature range, T
STG
Soldering temperature
(1)
(2)
(3)
(3)
UNIT
V
V
V
mA
mA
mA
mA
°C
°C
°C
–0.3 to +3.6
–0.3 to V
DD
+ 0.3
–0.3 to +3.6
5
–5
±10
±10
See
Table
–40 to +85
–65 to +150
+260
Stresses beyond those listed under
may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under
is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
All voltage values are with respect to GND. For reliable operation, the device must not be operated at 3.6 V for more than t = 1000h
continuously.
Output is clamped for push-pull outputs by the back gate diodes internal to the IC. No clamp exists for the open-drain outputs.
2
Copyright © 2001–2007, Texas Instruments Incorporated
TI [ TEXAS INSTRUMENTS ]
