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TMS570LS3137 参数 Datasheet PDF下载

TMS570LS3137图片预览
型号: TMS570LS3137
PDF下载: 下载PDF文件 查看货源
内容描述: TMS570LS3137 16位/ 32位RISC闪存微控制器 [TMS570LS3137 16/32-Bit RISC Flash Microcontroller]
分类和应用: 闪存微控制器
文件页数/大小: 159 页 / 2834 K
品牌: TI [ TEXAS INSTRUMENTS ]
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TMS570LS3137  
SPNS162.SEPTEMBER 2011  
www.ti.com  
2.4.1.13 Clock Inputs and Outputs  
Table 2-17. PGE Clock Inputs and Outputs  
Terminal  
Signal  
Type  
Default  
Pull State  
Pull Type  
Description  
Signal Name  
144  
PGE  
OSCIN  
18  
Input  
-
-
From external  
crystal/resonator, or  
external clock input  
KELVIN_GND  
OSCOUT  
19  
20  
Input  
Kelvin ground for oscillator  
Output  
To external  
crystal/resonator  
ECLK  
119  
14  
I/O  
Pull Down Programmable, External prescaled clock  
20uA  
output, or GIO.  
GIOA[5]/EXTCLKIN  
Input Pull Down 20uA  
External clock input #1  
2.4.1.14 Test and Debug Modules Interface  
Table 2-18. PGE Test and Debug Modules Interface  
Terminal  
Signal  
Type  
Default  
Pull State  
Pull Type  
Description  
Signal Name  
144  
PGE  
TEST  
nTRST  
RTCK  
TCK  
34  
I/O  
Input  
Output  
Input  
I/O  
Pull Down Fixed, 100uA  
Test enable  
109  
113  
112  
110  
111  
108  
JTAG test hardware reset  
JTAG return test clock  
JTAG test clock  
-
-
Pull Down Fixed, 100uA  
Pull Up  
TDI  
JTAG test data in  
JTAG test data out  
JTAG test select  
TDO  
I/O  
Pull Down  
TMS  
I/O  
Pull Up  
2.4.1.15 Flash Supply and Test Pads  
Table 2-19. PGE Flash Supply and Test Pads  
Terminal  
Signal  
Type  
Default  
Pull State  
Pull Type  
Description  
Signal Name  
144  
PGE  
VCCP  
FLTP1  
FLTP2  
134  
7
Input  
-
-
Flash pump supply  
Flash test pads. These  
terminals are reserved for  
TI use only. For proper  
operation these terminals  
must connect only to a  
test pad or not be  
8
connected at all [no  
connect (NC)].  
20  
Device Package and Terminal Functions  
Copyright © 2011, Texas Instruments Incorporated  
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