TLC5970
SBVS140 –MARCH 2010
www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
ORDERING INFORMATION(1)
TRANSPORT MEDIA,
PRODUCT
PACKAGE-LEAD
ORDERING NUMBER
TLC5970DAPR
TLC5970DAP
QUANTITY
Tape and Reel, 2000
Tube, 46
HTSSOP-32 PowerPAD™(2)
TLC5970
TLC5970RHPR
TLC5970RHPT
Tape and Reel, 3000
Tape and Reel, 250
QFN-28 6.0 mm × 6.0 mm
(1) For the most current package and ordering information see the Package Option Addendum at the end of this document, or see the TI
web site at www.ti.com.
(2) Product preview device.
ABSOLUTE MAXIMUM RATINGS(1)(2)
Over operating free-air temperature range, unless otherwise noted.
VALUE
UNIT
MIN
–0.3
–0.3
–0.3
–0.3
–0.3
–10
MAX
Supply voltage
Input voltage
VCC
+40
V
V
BOOT
+50
BOOT-PH difference
FB
+10
V
+18
V
IREF0 to IREF2, SWOFF
SDTA, SDTB, SCKA, SCKB
VROM
VREG + 0.3
+15
V
V
–0.3
–0.6
+21
V
PH (steady-state)
PH (transient < 10 ns)
OUT0 to OUT2
SDTY, SDTZ, SCKY, SCKZ
VREG, VREGIF
PH (dc)
+40
V
–1.2
V
Output voltage
Output current
–0.3
–10
+18
V
+15
V
–0.3
+6
V
–800
–2
mA
A
PH (peak)
OUT0 to OUT2
SDTY, SDTZ, SCKY, SCKZ
+180
+35
mA
mA
–35
Human body model (HBM) SDTA, SDTB, SCKA, SCKB,
SDTY, SDTZ, SCKY, SCKZ
4
2
kV
kV
V
Human body model (HBM) Other pins
Electrostatic discharge rating
Charged device model (CDM) SDTA, SDTB, SCKA, SCKB,
SDTY, SDTZ, SCKY, SCKZ
1000
Charged device model (CDM) Other pins
500
+150
+150
V
Operation junction temperature
Storage temperature
TJ (max)
Tstg
°C
°C
–55
(1) Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating
conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) All voltage values are with respect to network ground terminal.
2
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