SINGLE BUFFER/DRIVER
WITH OPEN-DRAIN OUTPUT
www.ti.com
SCES296V – FEBRUARY 2000 – REVISED FEBRUARY 2007
FEATURES
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Available in the Texas Instruments
NanoFree™ Package
Supports 5-V V
CC
Operation
Input and Open-Drain Output Accept
Voltages up to 5.5 V
Max t
pd
of 4.2 ns at 3.3 V
Low Power Consumption, 10-µA Max I
CC
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±24-mA
Output Drive at 3.3 V
I
off
Supports Partial-Power-Down Mode
Operation
Latch-Up Performance Exceeds 100 mA Per
JESD 78, Class II
ESD Protection Exceeds JESD 22
– 2000-V Human-Body Model (A114-A)
– 200-V Machine Model (A115-A)
– 1000-V Charged-Device Model (C101)
DRL PACKAGE
(TOP VIEW)
DBV PACKAGE
(TOP VIEW)
DCK PACKAGE
(TOP VIEW)
NC
A
GND
1
5
V
CC
NC
A
1
2
3
5
V
CC
NC
A
1
2
3
5
V
CC
Y
2
GND
4
4
Y
GND
4
3
Y
DRY PACKAGE
(TOP VIEW)
YZP PACKAGE
(BOTTOM VIEW)
YZV PACKAGE
(BOTTOM VIEW)
NC
A
GND
1
2
3
6
5
4
V
CC
NC
Y
GND
A
DNU
3 4
2
1 5
Y
V
CC
GND
A
2 3
1 4
Y
V
CC
DNU − Do not use
NC – No internal connection
See mechanical drawings for dimensions.
DESCRIPTION/ORDERING INFORMATION
This single buffer/driver is designed for 1.65-V to 5.5-V V
CC
operation.
NanoFree™ package technology is a major breakthrough in IC packaging concepts, using the die as the
package.
The output of the SN74LVC1G07 device is open drain and can be connected to other open-drain outputs to
implement active-low wired-OR or active-high wired-AND functions. The maximum sink current is 32 mA.
This device is fully specified for partial-power-down applications using I
off
.The I
off
circuitry disables the outputs,
preventing damaging current backflow through the device when it is powered down.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
NanoFree is a trademark of Texas Instruments.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2000–2007, Texas Instruments Incorporated
TI [ TEXAS INSTRUMENTS ]
