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SN65HVD3082EDRG4 参数 Datasheet PDF下载

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型号: SN65HVD3082EDRG4
PDF下载: 下载PDF文件 查看货源
内容描述: 低功耗RS - 485收发器,可在小型MSOP- 8Package [Low-Power RS-485 Transceivers, Available in a Small MSOP-8Package]
分类和应用:
文件页数/大小: 26 页 / 892 K
品牌: TI [ TEXAS INSTRUMENTS ]
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SLLS562G – AUGUST 2009 – REVISED MAY 2009
RECOMMENDED OPERATING CONDITIONS
(1)
over operating free-air temperature range unless otherwise noted
MIN
Supply voltage, V
CC
Voltage at any bus terminal (separately or common mode) , V
I
High-level input voltage (D, DE, or RE inputs), V
IH
Low-level input voltage (D, DE, or RE inputs), V
IL
Differential input voltage, V
ID
Output current, I
O
Differential load resistance, R
L
SN65HVD3082E, SN75HVD3082E
Signaling rate, 1/t
UI
SN65HVD3085E
SN65HVD3088E
Operating free–air temperature, T
A
Junction temperature, T
J
(1)
(2)
(2)
NOM
MAX
5.5
12
V
CC
0.8
12
60
8
UNIT
V
V
V
V
mA
4.5
–7
2
0
–12
Driver
Receiver
–60
–8
54
60
0.2
1
20
–40
0
–40
85
70
130
°C
°C
Mbps
SN65HVD3082E, SN65HVD3085E, SN65HVD3088E
SN75HVD3082E
The algebraic convention, in which the least positive (most negative) limit is designated as minimum is used in this data sheet.
See thermal characteristics table for information on maintenance of this specification for the DGK package.
SUPPLY CURRENT
over operating free-air temperature range (unless otherwise noted)
PARAMETER
Driver and receiver enabled
Driver enabled, receiver disabled
I
CC
Receiver enabled, driver disabled
Driver and receiver disabled
(1)
TEST CONDITIONS
D at V
CC
or open, DE at V
CC
,
RE at 0 V, No load
D at V
CC
or open, DE at V
CC
,
RE at V
CC
, No load
D at V
CC
or open, DE at 0 V,
RE at 0 V, No load
D at V
CC
or open, DE at 0 V,
RE at V
CC
MIN
TYP
(1)
425
330
300
0.001
MAX
900
600
600
2
UNIT
µA
µA
µA
µA
All typical values are at 25°C and with a 5–V supply.
ELECTROSTATIC DISCHARGE PROTECTION
PARAMETER
Human body model
Human body model
(2)
Charged-device-model
(3)
TEST CONDITIONS
Bus terminals and GND
All pins
All pins
A, B, and GND
MIN
TYP
(1)
±15
±4
±1
±4
MAX
UNIT
kV
kV
kV
kV
Electrical Fast Transient/Burst
(4)
(1)
(2)
(3)
(4)
All typical values at 25°C.
Tested in accordance with JEDEC Standard 22, Test Method A114–A and IEC 60749–26.
Tested in accordance with JEDEC Standard 22, Test Method C101.
Tested in accordance with IEC 61000–4–4.
Copyright © 2009, Texas Instruments Incorporated
3
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