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OPA2180IDR 参数 Datasheet PDF下载

OPA2180IDR图片预览
型号: OPA2180IDR
PDF下载: 下载PDF文件 查看货源
内容描述: 0.1 μV / A ° Ç漂移,低噪声,轨到轨输出, 36 -V ,零漂移运算放大器 [0.1-μV/°C Drift, Low-Noise, Rail-to-Rail Output, 36-V, Zero-Drift OPERATIONAL AMPLIFIERS]
分类和应用: 运算放大器
文件页数/大小: 25 页 / 872 K
品牌: TI [ TEXAS INSTRUMENTS ]
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OPA2180  
OPA4180  
SBOS584B NOVEMBER 2011REVISED DECEMBER 2011  
www.ti.com  
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with  
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.  
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more  
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.  
PACKAGE INFORMATION(1)  
SPECIFIED  
PACKAGE-  
LEAD  
PACKAGE  
DESIGNATOR  
TEMPERATURE  
RANGE  
PACKAGE  
MARKING  
ORDERING  
NUMBER  
TRANSPORT MEDIA,  
QUANTITY  
PRODUCT  
DUAL  
OPA2180ID  
OPA2180IDR  
Rails, 100  
OPA2180  
SO-8  
D
40°C to +105°C  
40°C to +105°C  
2180  
TBD  
Tape and Reel, 2500  
Tape and Reel, 250  
Tape and Reel, 2500  
OPA2180IDGKT  
OPA2180IDGKR  
OPA2180(2)  
MSOP-8  
DGK  
QUAD  
OPA4180ID  
OPA4180IDR  
OPA4180IPW  
OPA4180IPWR  
Rails, 90  
SO-14  
D
40°C to +105°C  
40°C to +105°C  
OPA4180  
OPA4180  
Tape and Reel, 2000  
Rails, 90  
OPA4180(2)  
TSSOP-14  
PW  
Tape and Reel, 2000  
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or visit the  
device product folder at www.ti.com.  
(2) Shaded rows denote future product releases.  
ABSOLUTE MAXIMUM RATINGS(1)  
OPA2180, OPA4180  
±20, 40 (single supply)  
(V) 0.5 to (V+) + 0.5  
±10  
UNIT  
V
Supply voltage  
Voltage  
Current  
V
Signal input terminals  
mA  
Output short-circuit(2)  
Operating temperature  
Storage temperature  
Junction temperature  
Continuous  
55 to +125  
°C  
°C  
°C  
kV  
kV  
65 to +150  
+150  
1.5  
1
Human body model (HBM)  
ESD ratings  
Charged device model (CDM)  
(1) Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may  
degrade device reliability. These are stress ratings only and functional operation of the device at these or any other conditions beyond  
those specified is not implied.  
(2) Short-circuit to ground, one amplifier per package.  
2
Submit Documentation Feedback  
Copyright © 2011, Texas Instruments Incorporated  
Product Folder Link(s): OPA2180 OPA4180  
 
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