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73K324BL-IH/F 参数 Datasheet PDF下载

73K324BL-IH/F图片预览
型号: 73K324BL-IH/F
PDF下载: 下载PDF文件 查看货源
内容描述: 单芯片调制解调器瓦特/集成混合 [Single-Chip Modem w/ Integrated Hybrid]
分类和应用: 调制解调器电信集成电路电信电路
文件页数/大小: 34 页 / 205 K
品牌: TERIDIAN [ TERIDIAN SEMICONDUCTOR CORPORATION ]
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73K324BL  
CCITT V.22bis,V.23,V.22,V.21, Bell 212A  
Single-Chip Modem w/ Integrated Hybrid  
DATA SHEET  
To accomplish this, high speed digital devices should  
be locally bypassed, and the telephone line interface  
and K-Series device should be located close to each  
other near the area of the board where the phone line  
connection is accessed. To avoid problems, power  
supply and ground traces should be routed separately  
to the analog and digital functions on the board, and  
digital signals should not be routed near low level or  
high impedance analog traces. The analog and digital  
grounds should only connect at one point near the K-  
Series device ground pin to avoid ground loops. The  
K-Series modem ICs should have both high frequency  
and low frequency bypassing as close to the package  
as possible.  
BER VS. S/N  
This test measures the ability of the modem to  
operate over noisy lines with a minimum of data-  
transfer errors. Since some noise is generated in  
the best of dial-up lines, the modem must operate  
with the lowest S/N ratio possible. Better modem  
performance is indicated by test curves that are  
closest to the BER axis. A narrow spread between  
curves representing the four line parameters  
indicates minimal variation in performance while  
operating over a range of operating conditions.  
Typically, a DPSK modem will exhibit better BER  
performance test curves receiving in the low band  
than in the high band.  
MODEM PERFORMANCE  
CHARACTERISTICS  
BER VS. RECEIVE LEVEL  
This test measures the dynamic range of the  
modem. Because signal levels vary widely over  
dial-up lines, the widest possible dynamic range is  
desirable. The minimum Bell specification calls for  
36 dB of dynamic range. S/N ratios are held  
constant at the indicated values while the receive  
level is lowered from a very high to very low signal  
levels. The width of the “bowl” of these curves,  
taken at the BER point, is the measure of dynamic  
range.  
The curves presented here define modem IC  
performance under a variety of line conditions while  
inducing disturbances that are typical of those  
encountered during data transmission on public  
service telephone lines. Test data was taken using an  
TAS “1200” modem test set and line simulator,  
operating under computer control. All tests were run  
full-duplex, using a standard off-the-shelf modem as  
the reference modem. A 511 pseudo-random-bit  
pattern was used for each data point. Noise was C-  
message weighted and all signal-to-noise (S/N) ratios  
reflect total power measurements similar to the CCITT  
V.56 measurement specification. The individual tests  
are defined as follows.  
Page: 31 of 34  
© 2005, 2008 TERIDIAN Semiconductor Corporation  
Rev 6.1  
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