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71M6403 参数 Datasheet PDF下载

71M6403图片预览
型号: 71M6403
PDF下载: 下载PDF文件 查看货源
内容描述: 电子脱扣器 [Electronic Trip Unit]
分类和应用: 电子
文件页数/大小: 75 页 / 588 K
品牌: TERIDIAN [ TERIDIAN SEMICONDUCTOR CORPORATION ]
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71M6403  
Electronic Trip Unit  
SEPTEMBER 2006  
Real-Time Monitor  
The CE contains a Real Time Monitor (RTM), which can be programmed to monitor four selectable CE RAM locations at full  
sample rate. The four monitored locations are serially output to the TMUXOUT pin via the digital output multiplexer at the  
beginning of each CE code pass (see the Test Ports Section for details)  
Power Up Short Circuit Detection Time  
The 71M6403 detects a short circuit condition within less than 5 msec. (T2) after application of its power and a stable reference  
clock. This delay includes the firmware startup time for both the CE and the MPU, and for the CE to complete its initial  
measurements. The following diagram shows the timing delay of a CE trip indication relative to application of power and the  
reference clock.  
71M6403 Power  
T1  
Reference Clock  
T2  
CE FAULT_PULSE  
CE STROBE  
T1: Delay to stable reference clock operation  
T2: Delay to CE FAULT_PULSE assertion and  
first CE STROBE pulse ( < 5 msec)  
Power Up Detection Time  
The T1 delay is a system parameter dependent on the system clock architecture. T1 could be the start up time for an external  
oscillator powered from the same power source as the 71M6403, or T1 could be the delay from a system wide reference clock.  
If the reference clock is already stable prior to application of power to the 71M6403 (using a system wide reference clock), the  
T1 delay is eliminated. The resultant start up delay reduces to T2 assuming a “clean” application of power to the 71M6403.  
Page: 13 of 75  
© 2006 TERIDIAN Semiconductor Corporation  
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