80C154/83C154
Note 1 : ICC is measured with all output pins
Figure 15. ICC Test Condition, Idle Mode.
All other pins are disconnected.
disconnected ;
XTAL1
driven
with
TCLCH,
TCHCL = 5 ns, VIL = VSS + .5 V, VIH = VCC –.5 V ;
XTAL2 N.C. ; EA = RST = Port 0 = VCC. ICC would be
slighty higher if a crystal oscillator used.
Idle ICC is measured with all otput pins disconnected ;
XTAL1 driven with TCLCH, TCHCL = 5 ns, VIL =
VSS + 5 V, VIH = VCC -.5 V ; XTAL2 N.C ; Port
0 = VCC ; EA = RST = VSS.
Power Down ICC is measured with all output pins
disconnected ; EA = PORT 0 = VCC ; XTAL2 N.C. ;
RST = VSS.
Note 2 : Capacitance loading on Ports 0 and 2 may cause
spurious noise pulses to be superimposed on the VOLS of
ALE and Ports 1 and 3. The noise is due to external bus
capacitance discharging into the Port 0 and Port 2 pins
when these pins make 1 to 0 transitions during bus
operations. In the worst cases (capacitive loading 100
pF), the noise pulse on the ALE line may exceed 0.45 V
may exceed 0,45 V with maxi VOL peak 0.6 V A Schmitt
Trigger use is not necessary.
Figure 16. ICC Test Condition, Active Mode.
All other pins are disconnected.
Figure 17. ICC Test Condition, Power Down Mode.
All other pins are disconnected.
Figure 18. Clock Signal Waveform for ICC Tests in Active and Idle Modes. TCLCH = TCHCL = 5 ns.
18
MATRA MHS
Rev.F (14 Jan. 97)
TEMIC [ TEMIC SEMICONDUCTORS ]
